臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立成功大學	2003-09-01	Convergence of hot-carrier-induced saturation-region drain current and linear-region drain current degradation in advanced n-channel metal-oxide-semiconductor field-effect transistors	Chen, Jone F.; Tsao, Chih-Pin
國立成功大學	2003-04	The impact of gate-to-source tunneling current on the characterization of metal-oxide-semiconductor field-effect transistor's hot-carrier reliability	Chen, Jone-Fang; Tsao, Chih-Pin; Ong, T. C.
國立成功大學	2002-06-20	深次微米元件熱載子效應	曹志彬; Tsao, Chih-Pin
國立成功大學	2002-06-20	深次微米元件熱載子效應	曹志彬; Tsao, Chih-Pin

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