臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| 2826152
	???header.visitor??? : 31814205 ???header.onlineuser??? : 1117 ???header.sponsordeclaration???

???search.scope???

???search.advance???

???search.login???

???search.administrator???

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

???ui.leftmenu.abouttair???
	???ui.leftmenu.explanation???

???ui.leftmenu.bartitle???
	Repositories
	Author
	Title
	Date
	???ui.leftmenu.statisticschart???
	???ui.leftmenu.realtimefacts???
	???ui.leftmenu.trend???

???index.news???
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

???ui.leftmenu.copyrighttitle???
	???ui.leftmenu.copyrightpublisher???
	???ui.leftmenu.copyrightconference???

???ui.leftmenu.link???
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"tsao chih pin"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1???	???jsp.browse.items-by-author.order2???

Showing items 1-4 of 4 (1 Page(s) Totally)
1
View [10|25|50] records per page

Institution	Date	Title	Author
國立成功大學	2003-09-01	Convergence of hot-carrier-induced saturation-region drain current and linear-region drain current degradation in advanced n-channel metal-oxide-semiconductor field-effect transistors	Chen, Jone F.; Tsao, Chih-Pin
國立成功大學	2003-04	The impact of gate-to-source tunneling current on the characterization of metal-oxide-semiconductor field-effect transistor's hot-carrier reliability	Chen, Jone-Fang; Tsao, Chih-Pin; Ong, T. C.
國立成功大學	2002-06-20	深次微米元件熱載子效應	曹志彬; Tsao, Chih-Pin
國立成功大學	2002-06-20	深次微米元件熱載子效應	曹志彬; Tsao, Chih-Pin

Showing items 1-4 of 4 (1 Page(s) Totally)
1
View [10|25|50] records per page