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Institution Date Title Author
國立交通大學 2014-12-08T15:11:53Z Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stress Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang
國立交通大學 2014-12-08T15:11:35Z Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing model Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang

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