|
|
???tair.name??? >
???browser.page.title.author???
|
"tsao yu ching"???jsp.browse.items-by-author.description???
Showing items 1-10 of 13 (2 Page(s) Totally) 1 2 > >> View [10|25|50] records per page
| 國立交通大學 |
2020-10-05T02:02:01Z |
Interface Defect Shielding of Electron Trapping in a-InGaZnO Thin Film Transistors
|
Lin, Chih-Chih; Tai, Mao-Chou; Chang, Ting-Chang; Tsao, Yu-Ching; Wang, Yu-Xuan; Tsai, Yu-Lin; Tu, Hong-Yi; Lu, I-Nien; Tsai, Tsung-Ming; Huang, Jen-Wei |
| 國立交通大學 |
2020-09-30 |
Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors
|
Tu, Hong-Yi; Chang, Ting-Chang; Tsao, Yu-Ching; Tai, Mao-Chou; Tsai, Yu-Lin; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Lin, Chih-Chih; Kuo, Chuan-Wei; Tsai, Tsung-Ming; Wu, Chia-Chuan; Chien, Ya-Ting; Huang, Hui-Chun |
| 國立交通大學 |
2019-12-13T01:12:24Z |
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
|
Tu, Hong-Yi; Tsao, Yu-Ching; Tai, Mao-Chou; Chang, Ting-Chang; Tsai, Yu-Lin; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Chen, Hong-Chih; Tsai, Tsung-Ming; Wu, Chia-Chuan |
| 國立交通大學 |
2019-12-13T01:12:22Z |
Abnormal C-V Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs
|
Huang, Shin-Ping; Chen, Po-Hsun; Tsao, Yu-Ching; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Shih, Yao-Kai; Chung, Yu-Hua; Chen, Wei-Han; Wang, Terry Tai-Jui; Zhang, Sheng-Dong; Chang, Ting-Chang |
| 國立交通大學 |
2019-12-13T01:12:21Z |
Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
|
Chen, Hong-Chih; Kuo, Chuan-Wei; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Po-Hsun; Chen, Guan-Fu; Huang, Shin-Ping; Chen, Jian-Jie; Zhou, Kuan-Ju; Shih, Chih-Cheng; Tsao, Yu-Ching; Huang, Hui-Chun; Sze, Simon M. |
| 國立交通大學 |
2019-12-13T01:09:53Z |
Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors
|
Huang, Shin-Ping; Chen, Po-Hsun; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Tsao, Yu-Ching; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Lai, Wei-Chih; Chang, Ting-Chang |
| 國立交通大學 |
2019-10-05T00:08:43Z |
Improving Reliability of High-Performance Ultraviolet Sensor in a-InGaZnO Thin-Film Transistors
|
Tsai, Yu-Lin; Chien, Yu-Chieh; Chang, Ting-Chang; Tsao, Yu-Ching; Tai, Mao-Chou; Tu, Hong-Yi; Chen, Jian-Jie; Wang, Yu-Xuan; Zhou, Kuan-Ju; Shih, Yu-Shan; Lu, I-Nien; Huang, Hui-Chun |
| 國立交通大學 |
2019-10-05T00:08:39Z |
Effect of a-InGaZnO TFT Channel Thickness under Self-Heating Stress
|
Tai, Mao-Chou; Chang, Po-Wen; Chang, Ting-Chang; Tsao, Yu-Ching; Tsai, Yu-Lin; Tu, Hong-Yi; Wang, Yu-Xuan; Chen, Jian-Jie; Lin, Chih-Chih |
| 國立交通大學 |
2019-09-02T07:46:10Z |
A Dual-Gate InGaZnO4-Based Thin-Film Transistor for High-Sensitivity UV Detection
|
Chen, Po-Hsun; Tsao, Yu-Ching; Chien, Yu-Chieh; Chiang, Hsiao-Cheng; Chen, Hua-Mao; Lu, Ying-Hsin; Shih, Chih-Cheng; Tai, Mao-Chou; Chen, Guan-Fu; Tsai, Yu-Lin; Huang, Hui-Chun; Tsai, Tsung-Ming; Chang, Ting-Chang |
| 國立交通大學 |
2018-08-21T05:53:55Z |
Role of H2O Molecules in Passivation Layer of a-InGaZnO Thin Film Transistors
|
Chien, Yu-Chieh; Chang, Ting-Chang; Chiang, Hsiao-Cheng; Chen, Hua-Mao; Tsao, Yu-Ching; Shih, Chih-Cheng; Chen, Bo-Wei; Liao, Po-Yung; Chu, Ting-Yang; Yang, Yi-Chieh; Hung, Yu-Ju; Tsai, Tsung-Ming; Chang, Kuan-Chang |
Showing items 1-10 of 13 (2 Page(s) Totally) 1 2 > >> View [10|25|50] records per page
|