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机构 日期 题名 作者
國立交通大學 2015-07-21T11:21:07Z The growth of heteroepitaxial CuInSe2 on free-standing N-polar GaN Shih, Cheng-Hung; Lo, Ikai; You, Shuo-Ting; Tsai, Cheng-Da; Tseng, Bae-Heng; Chen, Yun-Feng; Chen, Chiao-Hsin; Lee, Chuo-Han; Lee, Wei-I; Hsu, Gary Z. L.
國立交通大學 2014-12-08T15:32:57Z Characteristics of hafnium oxide resistance random access memory with different setting compliance current Su, Yu-Ting; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Zhang, Rui; Lou, J. C.; Chen, Jung-Hui; Young, Tai-Fa; Chen, Kai-Huang; Tseng, Bae-Heng; Shih, Chih-Cheng; Yang, Ya-Liang; Chen, Min-Chen; Chu, Tian-Jian; Pan, Chih-Hung; Syu, Yong-En; Sze, Simon M.
國立交通大學 2014-12-08T15:31:21Z Performance and characteristics of double layer porous silicon oxide resistance random access memory Tsai, Tsung-Ming; Chang, Kuan-Chang; Zhang, Rui; Chang, Ting-Chang; Lou, J. C.; Chen, Jung-Hui; Young, Tai-Fa; Tseng, Bae-Heng; Shih, Chih-Cheng; Pan, Yin-Chih; Chen, Min-Chen; Pan, Jhih-Hong; Syu, Yong-En; Sze, Simon M.
國立交通大學 2014-12-08T15:28:27Z Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications Tsai, Tsung-Ming; Chang, Kuan-Chang; Chang, Ting-Chang; Syu, Yong-En; Chuang, Siang-Lan; Chang, Geng-Wei; Liu, Guan-Ru; Chen, Min-Chen; Huang, Hui-Chun; Liu, Shih-Kun; Tai, Ya-Hsiang; Gan, Der-Shin; Yang, Ya-Liang; Young, Tai-Fa; Tseng, Bae-Heng; Chen, Kai-Huang; Tsai, Ming-Jinn; Ye, Cong; Wang, Hao; Sze, Simon M.
國立交通大學 2014-12-08T15:28:19Z Dehydroxyl effect of Sn-doped silicon oxide resistance random access memory with supercritical CO2 fluid treatment Tsai, Tsung-Ming; Chang, Kuan-Chang; Chang, Ting-Chang; Syu, Yong-En; Liao, Kuo-Hsiao; Tseng, Bae-Heng; Sze, Simon M.
國立交通大學 2014-12-08T15:17:44Z A fabrication of germanium nanocrystal embedded in silicon-oxygen-nitride layer Tu, Chun-Hao; Chang, Ting-Chang; Liu, Po-Tsun; Liu, Hsin-Chou; Weng, Chi-Feng; Shy, Jang-Hung; Tseng, Bae-Heng; Tseng, Tseung-Yuan; Sze, Simon M.; Chang, Chun-Yen
國立交通大學 2014-12-08T15:13:26Z A novel nanowire channel poly-Si TFT functioning as transistor and nonvolatile SONOS memory Chen, Shih-Ching; Chang, Ting-Chang; Liu, Po-Tsun; Wu, Yung-Chun; Lin, Po-Shun; Tseng, Bae-Heng; Shy, Jang-Hung; Sze, S. M.; Chang, Chun-Yen; Lien, Chen-Hsin
國立成功大學 2013-10-14 Characteristics of hafnium oxide resistance random access memory with different setting compliance current Su, Yu-Ting; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Zhang, Rui; Lou, J. C.; Chen, Jung-Hui; Young, Tai-Fa; Chen, Kai-Huang; Tseng, Bae-Heng; Shih, Chih-Cheng; Yang, Ya-Liang; Chen, Min-Chen; Chu, Tian-Jian; Pan, Chih-Hung; Syu, Yong-En; Sze, Simon M.
國立成功大學 2013-06-24 Performance and characteristics of double layer porous silicon oxide resistance random access memory Tsai, Tsung-Ming; Chang, Kuan-Chang; Zhang, Rui; Chang, Ting-Chang; Lou, J. C.; Chen, Jung-Hui; Young, Tai-Fa; Tseng, Bae-Heng; Shih, Chih-Cheng; Pan, Yin-Chih; Chen, Min-Chen; Pan, Jhih-Hong; Syu, Yong-En; Sze, Simon M.
國立成功大學 2013-05-15 Characterization of CuInSe2 thin films grown by photo-assisted electrodeposition Su, Yin-Hsien; Chang, Tsung-Wei; Lee, Wen-Hsi; Tseng, Bae-Heng
國立成功大學 2012-12 Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications Tsai, Tsung-Ming; Chang, Kuan-Chang; Chang, Ting-Chang; Syu, Yong-En; Chuang, Siang-Lan; Chang, Geng-Wei; Liu, Guan-Ru; Chen, Min-Chen; Huang, Hui-Chun; Liu, Shih-Kun; Tai, Ya-Hsiang; Gan, Der-Shin; Yang, Ya-Liang; Young, Tai-Fa; Tseng, Bae-Heng; Chen, Kai-Huang; Tsai, Ming-Jinn; Ye, Cong; Wang, Hao; Sze, Simon M.
國立成功大學 2012-09-10 Dehydroxyl effect of Sn-doped silicon oxide resistance random access memory with supercritical CO2 fluid treatment Tsai, Tsung-Ming; Chang, Kuan-Chang; Chang, Ting-Chang; Syu, Yong-En; Liao, Kuo-Hsiao; Tseng, Bae-Heng; Sze, Simon M.
國立成功大學 2008-02 Preparation and characterization of CuInSe2 nano-particles Lu, Wei-Lun; Fu, Yaw-Shyan; Tseng, Bae-Heng

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