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机构 日期 题名 作者
國立交通大學 2017-04-21T06:48:45Z ESD Protection Design for Wideband RF Applications in 65-nm CMOS Process Chu, Li-Wei; Lin, Chun-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Tseng, Jen-Chou; Jou, Chewn-Pu; Tsai, Ming-Hsien
國立交通大學 2017-04-21T06:48:42Z Improving ESD Robustness of Stacked Diodes with Embedded SCR for RF Applications in 65-nm CMOS Lin, Chun-Yu; Fan, Mei-Lian; Ker, Ming-Dou; Chu, Li-Wei; Tseng, Jen-Chou; Song, Ming-Hsiang
國立交通大學 2015-07-21T08:31:29Z ESD Protection Design for Radio-Frequency Integrated Circuits in Nanoscale CMOS Technology Lin, Chun-Yu; Chu, Li-Wei; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Wei, Yu-Lin; Chang, Tzu-Heng
國立交通大學 2014-12-08T15:30:06Z Compact and Low-Loss ESD Protection Design for V-Band RF Applications in a 65-nm CMOS Technology Chu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng
國立交通大學 2014-12-08T15:28:40Z Design of ESD Protection Cell for Dual-Band RF Applications in a 65-nm CMOS Process Chu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng; Wei, Yu-Lin
國立交通大學 2014-12-08T15:28:05Z ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS Process Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng
國立交通大學 2014-12-08T15:09:48Z Board-Level ESD of Driver ICs on LCD Panel Tseng, Jen-Chou; Hsu, Chung-Ti; Tsai, Chia-Ku; Chen, Shu-Chuan; Ker, Ming-Dou
國立臺灣大學 2008 Lateral Nonuniformity Effects of Border Traps on the Characteristics of Metal–Oxide–Semiconductor Field-Effect Transistors Subjected to High-Field Stresses Tseng, Jen-Chou; Hwu, Jenn-Gwo
國立臺灣大學 2007 靜電放電產生之高電場電流脈衝對金氧半元件之效應 曾仁洲; Tseng, Jen-Chou
國立臺灣大學 2007 Effects of electrostatic discharge high-field current impulse on oxide breakdown Tseng, Jen-Chou; Hwu, Jenn-Gwo
國立臺灣大學 2007 Oxide-trapped charges induced by electrostatic discharge impulse stress Tseng, Jen-Chou; Hwu, Jenn-Gwo

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