|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"tseng tseung yuen"
Showing items 86-135 of 359 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
| 國立交通大學 |
2018-08-21T05:54:10Z |
Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO2 Layer in p-MOSFETs
|
Lu, Ying-Hsin; Chang, Ting-Chang; Liao, Jih-Chien; Chen, Li-Hui; Lin, Yu-Shan; Chen, Ching-En; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-Yu; Lien, Chen-Hsin; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting |
| 國立交通大學 |
2018-08-21T05:54:05Z |
Enhancement of resistive switching properties in nitride based CBRAM device by inserting an Al2O3 thin layer
|
Kumar, Dayanand; Aluguri, Rakesh; Chand, Umesh; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-08-21T05:53:36Z |
Controlled resistive switching characteristics of ZrO2-based electrochemical metallization memory devices by modifying the thickness of the metal barrier layer
|
Chandrasekaran, Sridhar; Simanjuntak, Firman Mangasa; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-08-21T05:53:36Z |
Role of Al2O3 thin layer on improving the resistive switching properties of Ta5Si3-based conductive bridge random accesses memory device
|
Kumar, Dayanand; Aluguri, Rakesh; Chand, Umesh; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-08-21T05:53:18Z |
Conductive bridge random access memory characteristics of SiCN based transparent device due to indium diffusion
|
Kumar, Dayanand; Aluguri, Rakesh; Chand, Umesh; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-08-21T05:53:14Z |
An ultra-compact blackbody using electrophoretic deposited carbon nanotube films
|
Lin, Albert; Yang, Chien-Chih; Parashar, Parag; Lin, Chien-Yung; Jian, Ding Rung; Huang, Wei-Ming; Huang, Yi-Wen; Fu, Sze Ming; Zhong, Yan Kai; Tseng, Tseung Yuen |
| 國立交通大學 |
2018-08-21T05:53:11Z |
A Collective Study on Modeling and Simulation of Resistive Random Access Memory
|
Panda, Debashis; Sahu, Paritosh Piyush; Tseng, Tseung Yuen |
| 國立交通大學 |
2018-08-21T05:53:08Z |
Facile synthesis of mesoporous NiFe2O4/CNTs nanocomposite cathode material for high performance asymmetric pseudocapacitors
|
Kumar, Nagesh; Kumar, Amit; Huang, Guan-Min; Wu, Wen-Wei; Tseng, Tseung Yuen |
| 國立交通大學 |
2018-08-21T05:52:56Z |
Endurance improvement and resistance stabilization of transparent multilayer resistance switching devices with oxygen deficient WOx layer and heat dissipating AlN buffer layer
|
Lin, Yu-Hsuan; Huang, Ding-Chiuan; Lou, Jen-Chung; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-08-21T05:52:55Z |
Dynamic observation of reversible lithium storage phenomena in hybrid supercapacitor devices
|
Huang, Guan-Min; Tsai, Tsung-Chun; Huang, Chun-Wei; Kumar, Nagesh; Tseng, Tseung-Yuen; Wu, Wen-Wei |
| 國立交通大學 |
2018-08-21T05:52:54Z |
Role of nanorods insertion layer in ZnO-based electrochemical metallization memory cell
|
Simanjuntak, Firman Mangasa; Singh, Pragya; Chandrasekaran, Sridhar; Lumbantoruan, Franky Juanda; Yang, Chih-Chieh; Huang, Chu-Jie; Lin, Chun-Chieh; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-08-21T05:52:48Z |
Effect of barrier layer on switching polarity of ZrO2-based conducting-bridge random access memory
|
Chandrasekaran, Sridhar; Simanjuntak, Firman Mangasa; Tsai, Tsung-Ling; Lin, Chun-An; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:40:31Z |
高導電度膠態電解液於固態超級電容之應用
|
林皓陽; 曾俊元; Lin, Hao-Yang; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:40:30Z |
金屬氧化物選擇器搭配氧化鋯電阻式記憶體之特性研究
|
李承鴻; 曾俊元; Lee, Cheng-Hung; Tseng,Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:40:30Z |
氧化層雙向選擇器於電阻式記憶體之應用
|
楊敦智; 曾俊元; Yang, Tun-Chih; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:40:30Z |
單層氧化鎂選擇器應用於電阻式記憶體之研究
|
鄔晏澤; 曾俊元; Wu, Yan-ze; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:38:30Z |
納米電阻式記憶體導體特點的分析方法
|
白達磊; 曾俊元; berco, dan; Tseng,Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:38:03Z |
藉由電極調整及摻雜提升氧化鋅透明性電阻式記憶體電阻轉態特性
|
費玉滿; 曾俊元; 韋光華; FIRMAN, MANGASA SIMANJUNTAK; Tseng, Tseung-Yuen; Wei, Kung-Hwa |
| 國立交通大學 |
2018-01-24T07:37:07Z |
前瞻式金氧半場效電晶體之隨機電報訊號分析與熱載子劣化研究
|
陳慶恩; 曾俊元; 張鼎張; Chen, Ching-En; Tseng, Tseung-Yuen; Chang, Ting-Chang |
| 國立交通大學 |
2018-01-24T07:37:01Z |
利用碲為源層及增強阻障特性於氮化矽金屬導電橋接電阻式記憶體之可靠度優化研究
|
戴光駿; 曾俊元; Dai, Guang-Jyun; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:37:01Z |
二氧化鉿金屬橋樑電阻式記憶體之可靠度研究
|
黃楚傑; 曾俊元; Huang, Chu-Jie; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:37:01Z |
以電泳法沉積奈米碳管的電阻式記憶體之轉態特性研究
|
林千詠; 曾俊元; Lin, Chien-Yung; Tseng, Tseung-Yuen |
| 國立交通大學 |
2018-01-24T07:37:01Z |
三維多孔石墨烯/鎳鈷氧化物複合電極材料於 超級電容器之應用
|
李佳鴻; 曾俊元; Lee, Chia-Hong; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:56:40Z |
Enhanced Properties in Conductive-Bridge Resistive Switching Memory With Oxide-Nitride Bilayer Structure
|
Tsai, Tsung-Ling; Jiang, Fa-Shen; Ho, Chia-Hua; Lin, Chen-Hsi; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:56:33Z |
Facile production of graphene nanosheets comprising nitrogen-doping through in situ cathodic plasma formation during electrochemical exfoliation
|
Yen, Po-Jen; Ting, Chao-Chi; Chiu, Yung-Chi; Tseng, Tseung-Yuen; Hsu, Yao-Jane; Wu, Wen-Wei; Wei, Kung-Hwa |
| 國立交通大學 |
2017-04-21T06:56:31Z |
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics
|
Chen, Ching-En; Chang, Ting-Chang; You, Bo; Tsai, Jyun-Yu; Lo, Wen-Hung; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Hung, Yu-Ju; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen |
| 國立交通大學 |
2017-04-21T06:56:20Z |
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors
|
Lu, Ying-Hsin; Chang, Ting-Chang; Ho, Szu-Han; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting |
| 國立交通大學 |
2017-04-21T06:56:20Z |
Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs
|
Lin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Hsi-Wen; Lu, Ying-Hsin; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立交通大學 |
2017-04-21T06:56:08Z |
Observing the evolution of graphene layers at high current density
|
Huang, Chun-Wei; Chen, Jui-Yuan; Chiu, Chung-Hua; Hsin, Cheng-Lun; Tseng, Tseung-Yuen; Wu, Wen-Wei |
| 國立交通大學 |
2017-04-21T06:55:58Z |
A Novel Varying-Bias Read Scheme for MLC and Wide Temperature Range TMO ReRAM
|
Lin, Yu-Hsuan; Lee, Ming-Hsiu; Wu, Jau-Yi; Lin, Yu-Yu; Lee, Feng-Ming; Lee, Dai-Ying; Chiang, Kuang-Hao; Lai, Erh-Kun; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:55:48Z |
A stochastic simulation method for the assessment of resistive random access memory retention reliability
|
Berco, Dan; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:55:41Z |
A high performance transparent resistive switching memory made from ZrO2/AlON bilayer structure
|
Tsai, Tsung-Ling; Chang, Hsiang-Yu; Lou, Jesse Jen-Chung; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:55:22Z |
Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate
|
Liu, Hsi-Wen; Chang, Ting-Chang; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Kuan-Ju; Lu, Ying-Hsin; Lin, Chien-Yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Ye, Yi-Han |
| 國立交通大學 |
2017-04-21T06:55:16Z |
A numerical analysis of progressive and abrupt reset in conductive bridging RRAM
|
Berco, Dan; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:55:16Z |
A numerical study of forming voltage and switching polarity dependence on Ti top electrode thickness in Zr RRAM
|
Berco, Dan; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:55:16Z |
A comprehensive study of bipolar operation in resistive switching memory devices
|
Berco, Dan; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:55:13Z |
Impacts of Co doping on ZnO transparent switching memory device characteristics
|
Simanjuntak, Firman Mangasa; Prasad, Om Kumar; Panda, Debashis; Lin, Chun-An; Tsai, Tsung-Ling; Wei, Kung-Hwa; Tseng, Tseung-Yuen |
| 國立交通大學 |
2017-04-21T06:49:25Z |
Excellent Resistance Variability Control of WOx ReRAM by a Smart Writing Algorithm
|
Lin, Yu-Hsuan; Wu, Jau-Yi; Lee, Ming-Hsiu; Wang, Tien-Yen; Lin, Yu-Yu; Lee, Feng-Ming; Lee, Dai-Ying; Lai, Erh-Kun; Chiang, Kuang-Hao; Lung, Hsiang-Lan; Hsieh, Kuang-Yeu; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:01Z |
Fabrication of Flexible Electrochromic Devices Based on Tungsten Trioxide Nanobundles
|
Chen, Chih Hao; Tseng, Tseung-Yuen; Hung, Chung Jung |
| 國立交通大學 |
2017-04-21T06:48:32Z |
Effects of Second Phase and Defect on Electrical Properties in Bi0.5Na0.5-xKxTiO3 Lead-Free Piezoelectric Ceramics
|
Chen, Pin Yi; Chen, Cheng Sao; Chou, Chen-Chia; Tseng, Tseung-Yuen; Chen, Haydn |
| 國立交通大學 |
2017-04-21T06:48:19Z |
Diamond-shaped Ge and Ge0.9Si0.1 Gate-All-Around Nanowire FETs with Four {111} Facets by Dry Etch Technology
|
Lee, Yao-Jen; Hou, Fu-Ju; Chuang, Shang-Shiun; Hsueh, Fu-Kuo; Kao, Kuo-Hsing; Sung, Po-Jung; Yuan, Wei-You; Yao, Jay-Yi; Lu, Yu-Chi; Lin, Kun-Lin; Wu, Chien-Ting; Chen, Hisu-Chih; Chen, Bo-Yuan; Huang, Guo-Wei; Chen, Henry J. H.; Li, Jiun-Yun; Li, Yiming; Samukawa, Seiji; Chao, Tien-Sheng; Tseng, Tseung-Yuen; Wu, Wen-Fa; Hou, Tuo-Hung; Yeh, Wen-Kuan |
| 臺大學術典藏 |
2017 |
Preface
|
Tuan, Wei-Hsing; Chou, Chen-Chia; Tseng, Tseung-Yuen; Wang, Sea-Fue; Tseng, Wen-Jea; Shieh, Jay; Huang, Chi-Yuen; Chen, Jhewn-Kuang; TZONG-LIN JAY SHIEH |
| 國立成功大學 |
2016-12 |
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors
|
Lu, Ying-Hsin; Chang, Ting-Chang; Ho, Szu-Han; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting |
| 國立成功大學 |
2016-04-25 |
Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate
|
Liu, Hsi-Wen; Chang, Ting-Chang; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Kuan-Ju; Lu, Ying-Hsin; Lin, Chien-Yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Ye, Yi-Han |
| 國立成功大學 |
2016-04 |
Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics
|
Chen, Ching-En; Chang, Ting-Chang; You, Bo; Tsai, Jyun-Yu; Lo, Wen-Hung; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Hung, Yu-Ju; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen |
| 國立交通大學 |
2016-03-29T00:01:12Z |
Li2MnSiO4與奈米碳管及石墨烯複合材料於非對稱性超級電容之研究
|
曾俊元; TSENG TSEUNG-YUEN |
| 國立交通大學 |
2016-03-29T00:01:09Z |
前瞻高能量超高電容器整合製程及其應用平台開發(III)
|
曾俊元; TSENG TSEUNG-YUEN |
| 國立交通大學 |
2016-03-28T08:17:41Z |
前瞻高能量超高電容器整合製程及其應用平台開發( II )
|
曾俊元; TSENG TSEUNG-YUEN |
| 國立交通大學 |
2016-03-28T08:17:36Z |
錳氧化物奈米複合材料與新穎三維碳奈米結構修飾電極製備及其應用於可撓式非對稱型超高電容器系統之研究
|
曾俊元; TSENG TSEUNG-YUEN |
| 國立交通大學 |
2016-03-28T08:17:36Z |
新穎透明電阻式記憶體元件於高密度與低功率消耗的非揮發性記憶體應用
|
曾俊元; TSENG TSEUNG-YUEN |
Showing items 86-135 of 359 (8 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 > >>
View [10|25|50] records per page
|
