English  |  正體中文  |  简体中文  |  总笔数 :2823024  
造访人次 :  30273157    在线人数 :  1146
教育部委托研究计画      计画执行:国立台湾大学图书馆
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
关于TAIR

浏览

消息

著作权

相关连结

"tseng tseung yuen"的相关文件

回到依作者浏览
依题名排序 依日期排序

显示项目 101-125 / 359 (共15页)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
每页显示[10|25|50]项目

机构 日期 题名 作者
國立交通大學 2018-01-24T07:40:30Z 單層氧化鎂選擇器應用於電阻式記憶體之研究 鄔晏澤; 曾俊元; Wu, Yan-ze; Tseng, Tseung-Yuen
國立交通大學 2018-01-24T07:38:30Z 納米電阻式記憶體導體特點的分析方法 白達磊; 曾俊元; berco, dan; Tseng,Tseung-Yuen
國立交通大學 2018-01-24T07:38:03Z 藉由電極調整及摻雜提升氧化鋅透明性電阻式記憶體電阻轉態特性 費玉滿; 曾俊元; 韋光華; FIRMAN, MANGASA SIMANJUNTAK; Tseng, Tseung-Yuen; Wei, Kung-Hwa
國立交通大學 2018-01-24T07:37:07Z 前瞻式金氧半場效電晶體之隨機電報訊號分析與熱載子劣化研究 陳慶恩; 曾俊元; 張鼎張; Chen, Ching-En; Tseng, Tseung-Yuen; Chang, Ting-Chang
國立交通大學 2018-01-24T07:37:01Z 利用碲為源層及增強阻障特性於氮化矽金屬導電橋接電阻式記憶體之可靠度優化研究 戴光駿; 曾俊元; Dai, Guang-Jyun; Tseng, Tseung-Yuen
國立交通大學 2018-01-24T07:37:01Z 二氧化鉿金屬橋樑電阻式記憶體之可靠度研究 黃楚傑; 曾俊元; Huang, Chu-Jie; Tseng, Tseung-Yuen
國立交通大學 2018-01-24T07:37:01Z 以電泳法沉積奈米碳管的電阻式記憶體之轉態特性研究 林千詠; 曾俊元; Lin, Chien-Yung; Tseng, Tseung-Yuen
國立交通大學 2018-01-24T07:37:01Z 三維多孔石墨烯/鎳鈷氧化物複合電極材料於 超級電容器之應用 李佳鴻; 曾俊元; Lee, Chia-Hong; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:56:40Z Enhanced Properties in Conductive-Bridge Resistive Switching Memory With Oxide-Nitride Bilayer Structure Tsai, Tsung-Ling; Jiang, Fa-Shen; Ho, Chia-Hua; Lin, Chen-Hsi; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:56:33Z Facile production of graphene nanosheets comprising nitrogen-doping through in situ cathodic plasma formation during electrochemical exfoliation Yen, Po-Jen; Ting, Chao-Chi; Chiu, Yung-Chi; Tseng, Tseung-Yuen; Hsu, Yao-Jane; Wu, Wen-Wei; Wei, Kung-Hwa
國立交通大學 2017-04-21T06:56:31Z Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics Chen, Ching-En; Chang, Ting-Chang; You, Bo; Tsai, Jyun-Yu; Lo, Wen-Hung; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Hung, Yu-Ju; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen
國立交通大學 2017-04-21T06:56:20Z Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors Lu, Ying-Hsin; Chang, Ting-Chang; Ho, Szu-Han; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting
國立交通大學 2017-04-21T06:56:20Z Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs Lin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Hsi-Wen; Lu, Ying-Hsin; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung
國立交通大學 2017-04-21T06:56:08Z Observing the evolution of graphene layers at high current density Huang, Chun-Wei; Chen, Jui-Yuan; Chiu, Chung-Hua; Hsin, Cheng-Lun; Tseng, Tseung-Yuen; Wu, Wen-Wei
國立交通大學 2017-04-21T06:55:58Z A Novel Varying-Bias Read Scheme for MLC and Wide Temperature Range TMO ReRAM Lin, Yu-Hsuan; Lee, Ming-Hsiu; Wu, Jau-Yi; Lin, Yu-Yu; Lee, Feng-Ming; Lee, Dai-Ying; Chiang, Kuang-Hao; Lai, Erh-Kun; Tseng, Tseung-Yuen; Lu, Chih-Yuan
國立交通大學 2017-04-21T06:55:48Z A stochastic simulation method for the assessment of resistive random access memory retention reliability Berco, Dan; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:55:41Z A high performance transparent resistive switching memory made from ZrO2/AlON bilayer structure Tsai, Tsung-Ling; Chang, Hsiang-Yu; Lou, Jesse Jen-Chung; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:55:22Z Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate Liu, Hsi-Wen; Chang, Ting-Chang; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Kuan-Ju; Lu, Ying-Hsin; Lin, Chien-Yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Ye, Yi-Han
國立交通大學 2017-04-21T06:55:16Z A numerical analysis of progressive and abrupt reset in conductive bridging RRAM Berco, Dan; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:55:16Z A numerical study of forming voltage and switching polarity dependence on Ti top electrode thickness in Zr RRAM Berco, Dan; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:55:16Z A comprehensive study of bipolar operation in resistive switching memory devices Berco, Dan; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:55:13Z Impacts of Co doping on ZnO transparent switching memory device characteristics Simanjuntak, Firman Mangasa; Prasad, Om Kumar; Panda, Debashis; Lin, Chun-An; Tsai, Tsung-Ling; Wei, Kung-Hwa; Tseng, Tseung-Yuen
國立交通大學 2017-04-21T06:49:25Z Excellent Resistance Variability Control of WOx ReRAM by a Smart Writing Algorithm Lin, Yu-Hsuan; Wu, Jau-Yi; Lee, Ming-Hsiu; Wang, Tien-Yen; Lin, Yu-Yu; Lee, Feng-Ming; Lee, Dai-Ying; Lai, Erh-Kun; Chiang, Kuang-Hao; Lung, Hsiang-Lan; Hsieh, Kuang-Yeu; Tseng, Tseung-Yuen; Lu, Chih-Yuan
國立交通大學 2017-04-21T06:49:01Z Fabrication of Flexible Electrochromic Devices Based on Tungsten Trioxide Nanobundles Chen, Chih Hao; Tseng, Tseung-Yuen; Hung, Chung Jung
國立交通大學 2017-04-21T06:48:32Z Effects of Second Phase and Defect on Electrical Properties in Bi0.5Na0.5-xKxTiO3 Lead-Free Piezoelectric Ceramics Chen, Pin Yi; Chen, Cheng Sao; Chou, Chen-Chia; Tseng, Tseung-Yuen; Chen, Haydn

显示项目 101-125 / 359 (共15页)
<< < 1 2 3 4 5 6 7 8 9 10 > >>
每页显示[10|25|50]项目