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Showing items 276-300 of 359 (15 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:28:09Z |
Effects of Post-Deposition Annealing Atmosphere and Duration on Sol-Gel Derived Amorphous Indium-Zinc-Oxide Thin Film Transistors
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Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:28:09Z |
The Impact of Active Layer Pre-Treatment on Bias Stress Stability of Sol-gel Derived Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistor
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Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Chen, Yu-Chun; Li, Iue-Hen; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:27:50Z |
Investigation for coexistence of dual resistive switching characteristics in DyMn(2)O(5) memory devices
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Tsai, Yu-Ting; Chang, Ting-Chang; Huang, Wei-Li; Huang, Chih-Wen; Syu, Yong-En; Chen, Shih-Cheng; Sze, Simon M.; Tsai, Ming-Jinn; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:27:20Z |
Nitric Acid Oxidized ZrO(2) as the Tunneling Oxide of Cobalt Silicide Nanocrystal Memory Devices
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Hu, Chih-Wei; Chang, Ting-Chang; Tu, Chun-Hao; Chen, Yang-Dong; Lin, Chao-Cheng; Chen, Min-Chen; Lin, Jian-Yang; Sze, Simon M.; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:24:34Z |
ZnO Nanostructures for Sensor Applications
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Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:24:05Z |
Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Luo, Hung-Ping; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:23:56Z |
"Field Emission Properties and Reliability of ZnO Nanorod, Nanopagoda, and Nanotip Current Emitters"
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Yao, I. -Chuan; Lin, Pang; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:23:55Z |
Electrical Properties and Reliability of ZnO-Based Nanorod Current Emitters
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Yao, I-Chuan; Lin, Pang; Huang, Sheng-He; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:23:40Z |
A study on low-power, nanosecond operation and multilevel bipolar resistance switching in Ti/ZrO2/Pt nonvolatile memory with 1T1R architecture
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Wu, Ming-Chi; Jang, Wen-Yueh; Lin, Chen-Hsi; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:23:36Z |
Unipolar Resistive Switching Characteristics of a ZrO2 Memory Device With Oxygen Ion Conductor Buffer Layer
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Lee, Dai-Ying; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:23:05Z |
Effect of Top Electrode Material on Resistive Switching Characteristics in MnO2 Nonvolatile Memory Devices
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Tsai, Yu-Ting; Chang, Ting-Chang; Lin, Chao-Cheng; Chiang, Lan-Shin; Chen, Shih-Cheng; Sze, Simon M.; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:22:53Z |
Bottom Electrode Modification of ZrO2 Resistive Switching Memory Device with Au Nanodots
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Lee, Dai-Ying; Yao, I-Chuan; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:22:51Z |
Resistive switching characteristics of nickel silicide layer embedded HfO2 film
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Panda, Debashis; Huang, Chun-Yang; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:22:41Z |
ZnO nanorods grown on polymer substrates as UV photodetectors
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Yao, I-Chuan; Tseng, Tseung-Yuen; Lin, Pang |
| 國立交通大學 |
2014-12-08T15:22:32Z |
Characteristics of SrTiO(3) Insulated Layer in SBT Ferroelectric Thin Films
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Chou, Hsiu-Yu; Lee, En-Ko; Lin, Meng-Han; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:22:15Z |
Fabrication and resistive switching characteristics of high compact Ga-doped ZnO nanorod thin film devices
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Yao, I-Chuan; Lee, Dai-Ying; Tseng, Tseung-Yuen; Lin, Pang |
| 國立交通大學 |
2014-12-08T15:21:35Z |
Surface states related the bias stability of amorphous In-Ga-Zn-O thin film transistors under different ambient gasses
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Cheng; Chung, Wan-Fang; Chen, Yi-Hsien; Tai, Ya-Hsiang; Tseng, Tseung-Yuen; Yeh (Huang), Fon-Shan |
| 國立交通大學 |
2014-12-08T15:21:34Z |
Robust unipolar resistive switching of Co nano-dots embedded ZrO(2) thin film memories and their switching mechanism
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Wu, Ming-Chi; Wu, Tsung-Han; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:21:32Z |
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
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Chung, Wan-Fang; Chang, Ting-Chang; Lin, Chia-Sheng; Tu, Kuan-Jen; Li, Hung-Wei; Tseng, Tseung-Yuen; Chen, Ying-Chung; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:21:12Z |
Forming-free resistive switching behaviors in Cr-embedded Ga(2)O(3) thin film memories
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Lee, Dai-Ying; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:18:12Z |
Nonpolar Bistable Resistive Switching Behaviors of Bismuth Titanate Oxide Thin Film
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Lin, Meng-Han; Wu, Ming-Chi; Lin, Chun-Chieh; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:15:52Z |
Resistive switching mechanisms of V-doped SrZrO3 memory films
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Lin, Chun-Chieh; Tu, Bing-Chung; Lin, Chao-Cheng; Lin, Chen-Hsi; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:14:18Z |
Resistance switching properties of sol-gel derived SrZrO3 based memory thin films
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Liu, Chih-Yi; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:14:10Z |
Effect of top electrode material on resistive switching properties of ZrO2 film memory devices
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Lin, Chih-Yang; Wu, Chen-Yu; Wu, Chung-Yi; Lee, Tzyh-Cheang; Yang, Fu-Liang; Hu, Chenming; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:13:38Z |
SrTiO3-SiO2 oxide films for possible high-k gate dielectric applications
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Lin, Chun-Chieh; Lai, Li-Wen; Lin, Chih-Yang; Tseng, Tseung-Yuen |
Showing items 276-300 of 359 (15 Page(s) Totally)
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View [10|25|50] records per page
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