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Institution Date Title Author
國立交通大學 2014-12-08T15:41:07Z Moisture-induced material instability of porous organosilicate glass Chang, TC; Chen, CW; Liu, PT; Mor, YS; Tsai, HM; Tsai, TM; Yan, ST; Tu, CH; Tseng, TY; Sze, SM
國立交通大學 2014-12-08T15:40:42Z Direct Patterning of low-k hydrogen silsesquioxane using X-ray exposure technology (vol 6, pg G69, 2003) Chang, TC; Tsai, TM; Liu, PT; Mor, YS; Chen, CW; Sheu, JT; Tseng, TY
國立交通大學 2014-12-08T15:40:30Z Improvement in retention time of metal-ferroelectric-metal-insulator-semiconductor structures using MgO doped Ba0.7Sr0.3TiO3 insulator layer Tseng, TY; Lee, SY
國立交通大學 2014-12-08T15:39:59Z Electrical and dielectric properties of low-temperature crystallized Sr0.8Bi2.6Ta2O9+x thin films on Ir/SiO2/Si substrates Chou, HY; Chen, TM; Tseng, TY
國立交通大學 2014-12-08T15:39:52Z Studies on ferroelectric properties of sol-gel derived Pb(Zr0.53Ti0.47)O-3 using Ba0.5Sr0.5RuO3 as the conductive electrodes Wang, YK; Huang, CH; Tseng, TY; Linb, P
國立交通大學 2014-12-08T15:39:50Z Electrical properties of sputter deposited SrTiO3 gate dielectrics Liu, CY; Tseng, TY
國立交通大學 2014-12-08T15:39:49Z Correlation between deep depletion and current-voltage saturation of SrTiO3 gate dielectric capacitor Liu, CY; Tseng, TY
國立交通大學 2014-12-08T15:39:45Z Preferentially oriented ferroelectric Pb(Zr0.53Ti0.47)O(3)thin films on (110)BaRuO3/Ru/SiO2/Si substrates Wang, YK; Tseng, TY; Lin, P
國立交通大學 2014-12-08T15:39:45Z Pattern profile distortion and stress evolution in nanoporous organosilicates after photoresist stripping Liu, PT; Chen, CW; Chang, TC; Tseng, TY
國立交通大學 2014-12-08T15:39:45Z CMP of low-k methylsilsesquiazane with oxygen plasma treatment for multilevel interconnect applications Chang, TC; Tsai, TM; Liu, PT; Chen, CW; Yan, ST; Aoki, H; Chang, YC; Tseng, TY

Showing items 91-100 of 245  (25 Page(s) Totally)
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