| 國立交通大學 |
2014-12-08T15:42:30Z |
A method to characterize the dielectric and interfacial properties of metal-insulator-semiconductor structures by microwave measurement
|
Lue, HT; Tseng, TY; Huang, GW |
| 國立交通大學 |
2014-12-08T15:42:23Z |
Enhanced ferroelectric properties of Pb(Zr0.53Ti0.47)O-3 thin films on SrRuO3/Ru/SiO2/Si substrates
|
Wang, YK; Tseng, TY; Lin, P |
| 國立交通大學 |
2014-12-08T15:42:22Z |
Microwave penetration depth measurement for high T-c superconductors by dielectric resonators
|
Lue, HT; Lue, JT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:42:22Z |
Deep electron trapping centers in Te-doped (AlxGa1-x)(0.5)In0.5P (x=0.5) layers grown by metal-organic chemical vapor deposition
|
Sung, WJ; Huang, KF; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:42:13Z |
Characterization of porous silicate for ultra-low k dielectric application
|
Liu, PT; Chang, TC; Hsu, KC; Tseng, TY; Chen, LM; Wang, CJ; Sze, SM |
| 國立交通大學 |
2014-12-08T15:42:03Z |
Dependence of luminescence efficiency on dopant concentration and sintering temperature in the erbium-doped Ba0.7Sr0.3TiO3 thin films
|
Kuo, SY; Chen, CS; Tseng, TY; Chang, SC; Hsieh, WF |
| 國立交通大學 |
2014-12-08T15:42:00Z |
An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectric
|
Lue, HT; Liu, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:52Z |
Device modeling of ferroelectric memory field-effect transistor (FeMFET)
|
Lue, HT; Wu, CJ; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Electrical properties of metal-ferroelectric-insulator-semiconductor using sol-gel derived SrBi2Ta2O9 film and ultra-thin Si3N4 buffer layer
|
Huang, CH; Tseng, TY; Chien, CH; Yang, MJ; Leu, CC; Chang, TC; Liu, PT; Huang, TY |
| 國立交通大學 |
2014-12-08T15:41:39Z |
The novel pattern method of low-k hybrid-organic-siloxane-polymer film using X-ray exposure
|
Chang, TC; Tsai, TM; Liu, PT; Mor, YS; Chen, CW; Mei, YJ; Sheu, JT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Effects of nitridation of silicon and repeated spike heating on the electrical properties of SrTiO3 gate dielectrics
|
Liu, CY; Lue, HT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:36Z |
Variation of electrical properties of Sro(0.8)Bi(2+x)Ta(2)O(9+delta) ferroelectric thin films with bismuth content
|
Chou, HY; Tseng, TY; Chen, TM |
| 國立交通大學 |
2014-12-08T15:41:31Z |
Copper-catalyzed ZnO nanowires on silicon (100) grown by vapor-liquid-solid process
|
Li, SY; Lee, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:26Z |
Device Modeling of ferroelectric memory field-effect transistor for the application of ferroelectric random access memory
|
Lue, HT; Wu, CJ; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:24Z |
Electrical and dielectric properties of (Ba0.5Sr0.5)TiO3 thin films prepared by a hydroxide-alkoxide precursor-based sol-gel method
|
Nayak, M; Lee, SY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:07Z |
Moisture-induced material instability of porous organosilicate glass
|
Chang, TC; Chen, CW; Liu, PT; Mor, YS; Tsai, HM; Tsai, TM; Yan, ST; Tu, CH; Tseng, TY; Sze, SM |
| 國立交通大學 |
2014-12-08T15:40:42Z |
Direct Patterning of low-k hydrogen silsesquioxane using X-ray exposure technology (vol 6, pg G69, 2003)
|
Chang, TC; Tsai, TM; Liu, PT; Mor, YS; Chen, CW; Sheu, JT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:40:30Z |
Improvement in retention time of metal-ferroelectric-metal-insulator-semiconductor structures using MgO doped Ba0.7Sr0.3TiO3 insulator layer
|
Tseng, TY; Lee, SY |
| 國立交通大學 |
2014-12-08T15:39:59Z |
Electrical and dielectric properties of low-temperature crystallized Sr0.8Bi2.6Ta2O9+x thin films on Ir/SiO2/Si substrates
|
Chou, HY; Chen, TM; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:52Z |
Studies on ferroelectric properties of sol-gel derived Pb(Zr0.53Ti0.47)O-3 using Ba0.5Sr0.5RuO3 as the conductive electrodes
|
Wang, YK; Huang, CH; Tseng, TY; Linb, P |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Electrical properties of sputter deposited SrTiO3 gate dielectrics
|
Liu, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:49Z |
Correlation between deep depletion and current-voltage saturation of SrTiO3 gate dielectric capacitor
|
Liu, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:45Z |
Preferentially oriented ferroelectric Pb(Zr0.53Ti0.47)O(3)thin films on (110)BaRuO3/Ru/SiO2/Si substrates
|
Wang, YK; Tseng, TY; Lin, P |
| 國立交通大學 |
2014-12-08T15:39:45Z |
Pattern profile distortion and stress evolution in nanoporous organosilicates after photoresist stripping
|
Liu, PT; Chen, CW; Chang, TC; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:45Z |
CMP of low-k methylsilsesquiazane with oxygen plasma treatment for multilevel interconnect applications
|
Chang, TC; Tsai, TM; Liu, PT; Chen, CW; Yan, ST; Aoki, H; Chang, YC; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:43Z |
Investigation of the electrical properties and reliability of amorphous SiCN
|
Chen, CW; Chang, TC; Liu, PT; Tsai, TM; Huang, HC; Chen, JM; Tseng, CH; Liu, CC; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:36Z |
Electrical and dielectric behavior of fluorite-like Sr0.8Bi2.6Ta2O9 thin films pyrolyzed and thermally annealed at 450 degrees C
|
Huang, CH; Chou, HY; Lian, CW; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:21Z |
Field emission and photofluorescent characteristics of zinc oxide nanowires synthesized by a metal catalyzed vapor-liquid-solid process
|
Li, SY; Lin, P; Lee, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:16Z |
Method to improve chemical-mechanical-planarization polishing rate of low-k methyl-silsesquiazane for ultralarge scale integrated interconnect application
|
Chang, TC; Tsai, TM; Liu, PT; Yan, ST; Chang, YC; Aoki, H; Sze, SM; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:39:10Z |
Deep depletion phenomenon of SrTiO3 gate dielectric capacitor
|
Liu, CY; Chen, BY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:38:52Z |
Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin films
|
Huang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:38:47Z |
Effect of atmosphere on growth of single crystal zinc oxide nanowires
|
Li, SY; Lin, P; Lee, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:38:41Z |
Dielectric characteristics of nanocrystalline Ag-Ba0.5Sr0.5TiO3 composite thin films
|
Jayadevan, KP; Liu, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:38:40Z |
Effect of Sn dopant on the properties of ZnO nanowires
|
Li, SY; Lin, P; Lee, CY; Tseng, TY; Huang, CJ |
| 國立交通大學 |
2014-12-08T15:37:21Z |
Fabrication of vertical ZnO nanowires on silicon(100) with epitaxial ZnO buffer layer
|
Li, SY; Lin, P; Lee, CY; Ho, MS; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:37:10Z |
Study on etching profile of nanoporous silica
|
Chen, CW; Chang, TC; Liu, PT; Tsai, TM; Wu, HH; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:37:10Z |
Study on the effect of electron beam curing on low-K porous organosilicate glass (OSG) material
|
Chang, TC; Tsai, TM; Liu, PT; Chen, CW; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:37:10Z |
Cu-penetration induced breakdown mechanism for a-SiCN
|
Chen, CW; Liu, PT; Chang, TC; Yang, JH; Tsai, TM; Wu, HH; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Effects of oxygen plasma ashing on barrier dielectric SiCN film
|
Chen, CW; Chang, TC; Liu, PT; Tsai, TM; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:37:01Z |
Characteristics and electrochemical performance of supercapacitors with manganese oxide-carbon nanotube nanocomposite electrodes
|
Lee, CY; Tsai, HM; Chuang, HJ; Li, SY; Lin, P; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:36:06Z |
Electrical degradation of N-channel poly-Si TFT under AC stress
|
Chen, CW; Chang, TC; Liu, PT; Lu, HY; Tsai, TM; Weng, CF; Hu, CW; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:27:53Z |
THE INVESTIGATION OF ER-DOPED GLASSES BY 2-STEP HYDROLYSIS WITH N,N-DIMETHYL FORMAMIDE
|
FRAN, YS; TSENG, TY; HSIEH, WF |
| 國立交通大學 |
2014-12-08T15:27:38Z |
Luminescent properties of sol-gel prepared Y3Al5O12:Tb thin films
|
Lo, JR; Tseng, TY; Tyan, JH; Huang, JCM |
| 國立交通大學 |
2014-12-08T15:27:13Z |
Properties and reliability of Ta2O5 thin films deposited on Ta
|
Ezhilvalavan, S; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:26:33Z |
A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurement
|
Lue, HT; Tseng, TY; Huang, GW |
| 國立交通大學 |
2014-12-08T15:19:28Z |
Low temperature synthesized Sn doped indium oxide nanowires
|
Li, SY; Lee, CY; Lin, P; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:18:59Z |
Bistable resistive switching of a sputter-deposited Cr-doped SrZrO3 memory film
|
Liu, CY; Wu, PH; Wang, A; Jang, WY; Young, JC; Chiu, KY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:18:48Z |
ZnO nanowires hydrothermally grown on PET polymer substrates and their characteristics
|
Lee, CY; Li, SY; Lin, P; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:18:45Z |
Dielectric and electrical properties of SrTiO(3+/-y)-(SiO2)(x) thin films
|
Chou, HY; Chen, TM; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:18:42Z |
Single-crystalline MgxZn1-xO (0 <= x <= 0.25) nanowires on glass substrates obtained by a hydrothermal method: growth, structure and electrical characteristics
|
Lee, CY; Tseng, TY; Li, SY; Lin, P |
