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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:46:04Z Structure-related optical properties of rapid thermally annealed Ba0.7Sr0.3TiO3 thin films Kuo, YF; Tseng, TY
國立交通大學 2014-12-08T15:45:43Z Electrical properties of Ta2O5 thin films deposited on Cu Ezhilvalavan, S; Tseng, TY
國立交通大學 2014-12-08T15:45:40Z Effects of A/B cation ratio on the microstructure and lifetime of (Ba1-xCax)(z)(Ti0.99-y ZryMn0.01)O-3 (BCTZM) sintered in reducing atmosphere Lee, WH; Tseng, TY; Hennings, D
國立交通大學 2014-12-08T15:45:36Z Effect of bottom electrodes on resistance degradation and breakdown of (Ba, Sr)TiO3 thin films Tsai, MS; Tseng, TY
國立交通大學 2014-12-08T15:45:16Z Dielectric relaxation and defect analysis of Ta2O5 thin films Ezhilvalavan, S; Tsai, MS; Tseng, TY
國立交通大學 2014-12-08T15:45:15Z Surface modification of Dy2O3-Nb2O5 dope mix for dielectric materials in aqueous dispersion Lee, WH; Tseng, TY; Hennings, D
國立交通大學 2014-12-08T15:45:13Z Effects of calcination temperature and A/B ratio on the dielectric properties of (Ba,Ca)(Ti,Zr,Mn)O-3 for multilayer ceramic capacitors with nickel electrodes Lee, WH; Tseng, TY; Hennings, DFK
國立交通大學 2014-12-08T15:45:13Z Study of linear and nonlinear optical properties of distorted Ti-O-6 perovskite structure in BaxSr1-xTiO3 Chen, WK; Cheng, CM; Huang, JY; Hsieh, WF; Tseng, TY
國立交通大學 2014-12-08T15:45:06Z Sintering BaTi4O9/Ba2Ti9O20-based ceramics by glass addition Cheng, CM; Yang, CF; Lo, SH; Tseng, TY
國立交通大學 2014-12-08T15:44:55Z The effect of oxygen-to-argon ratio on the electrical and reliability characteristics of sputtered Sr0.8Bi2.5Ta1.2Nb0.9O9+x thin films Tsai, MS; Tseng, TY
國立交通大學 2014-12-08T15:44:55Z Progress in the developments of (Ba,Sr)TiO3 (BST) thin films for Gigabit era DRAMs Ezhilvalavan, S; Tseng, TY
國立交通大學 2014-12-08T15:44:20Z Sol-gel derived (Ba0.5Sr0.5)TiO3 thin films and their electrical and dielectric properties Nayak, M; Lee, SY; Tseng, TY
國立交通大學 2014-12-08T15:44:16Z Effects of ceramic processing parameters on the microstructure and dielectric properties of (Ba1-xCax)(Ti0.99-y, ZryMn0.01)O-3 sintered in a reducing atmosphere Lee, WH; Tseng, TY; Hennings, D
國立交通大學 2014-12-08T15:43:55Z Elimination of dielectric degradation for chemical-mechanical planarization of low-k hydrogen silisesquioxane Chang, TC; Liu, PT; Tsai, TM; Yeh, FS; Tseng, TY; Tsai, MS; Chen, BC; Yang, YL; Sze, SM
國立交通大學 2014-12-08T15:43:36Z Thermal-treatment induced deep electron traps in AlInP Sung, WJ; Huang, KF; Lin, WJ; Tseng, TY
國立交通大學 2014-12-08T15:43:30Z Gamma-ray induced deep electron traps in GaInP Sung, WJ; Liu, TY; Yang, SL; Huang, KF; Tseng, TY; Chou, FI; Wei, YY; Wu, YR
國立交通大學 2014-12-08T15:43:15Z Application of on-wafer TRL calibration on the measurement of microwave properties of Ba0.5Sr0.5TiO3 thin films Lue, HT; Tseng, TY
國立交通大學 2014-12-08T15:43:11Z Deep hole traps created by gamma-ray irradiation of GaInP Sung, WJ; Liu, TY; Yang, SL; Huang, KF; Tseng, TY; Chou, FI; Wei, YY
國立交通大學 2014-12-08T15:43:09Z Generalized interconnect delay time and crosstalk models: I. Applications of interconnect optimization design Lee, TGY; Tseng, TY; Wong, SC; Yang, CJ; Liang, MS; Cheng, HC
國立交通大學 2014-12-08T15:43:09Z Generalized interconnect delay time and crosstalk models: II. Crosstalk-induced delay time deterioration and worst crosstalk models Lee, TGY; Tseng, TY; Wong, SC; Yang, CJ; Liang, MS; Cheng, HC
國立交通大學 2014-12-08T15:43:09Z The effects of low-pressure rapid thermal post-annealing on the properties of (Ba,Sr)TiO3 thin films deposited by liquid source misted chemical deposition Yang, MJ; Chien, CH; Leu, CC; Zhang, RJ; Wu, SC; Huang, TY; Tseng, TY
國立交通大學 2014-12-08T15:42:49Z A model of non-homogeneous damped electromagnetic wave and heat equation in ferrite materials Tung, MJ; Chen, R; Hsu, CH; Tseng, TY
國立交通大學 2014-12-08T15:42:39Z Electrical and dielectric behavior of MgO doped Ba0.7Sr0.3TiO3 thin films on Al2O3 substrate Lee, SY; Tseng, TY
國立交通大學 2014-12-08T15:42:31Z Dielectric tunability of barium strontium titanate films prepared by a sol-gel method Nayak, M; Tseng, TY
國立交通大學 2014-12-08T15:42:30Z A method to characterize the dielectric and interfacial properties of metal-insulator-semiconductor structures by microwave measurement Lue, HT; Tseng, TY; Huang, GW

Showing items 51-75 of 244  (10 Page(s) Totally)
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