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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Showing items 96-120 of 245  (10 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:39:50Z Electrical properties of sputter deposited SrTiO3 gate dielectrics Liu, CY; Tseng, TY
國立交通大學 2014-12-08T15:39:49Z Correlation between deep depletion and current-voltage saturation of SrTiO3 gate dielectric capacitor Liu, CY; Tseng, TY
國立交通大學 2014-12-08T15:39:45Z Preferentially oriented ferroelectric Pb(Zr0.53Ti0.47)O(3)thin films on (110)BaRuO3/Ru/SiO2/Si substrates Wang, YK; Tseng, TY; Lin, P
國立交通大學 2014-12-08T15:39:45Z Pattern profile distortion and stress evolution in nanoporous organosilicates after photoresist stripping Liu, PT; Chen, CW; Chang, TC; Tseng, TY
國立交通大學 2014-12-08T15:39:45Z CMP of low-k methylsilsesquiazane with oxygen plasma treatment for multilevel interconnect applications Chang, TC; Tsai, TM; Liu, PT; Chen, CW; Yan, ST; Aoki, H; Chang, YC; Tseng, TY
國立交通大學 2014-12-08T15:39:43Z Investigation of the electrical properties and reliability of amorphous SiCN Chen, CW; Chang, TC; Liu, PT; Tsai, TM; Huang, HC; Chen, JM; Tseng, CH; Liu, CC; Tseng, TY
國立交通大學 2014-12-08T15:39:36Z Electrical and dielectric behavior of fluorite-like Sr0.8Bi2.6Ta2O9 thin films pyrolyzed and thermally annealed at 450 degrees C Huang, CH; Chou, HY; Lian, CW; Tseng, TY
國立交通大學 2014-12-08T15:39:21Z Field emission and photofluorescent characteristics of zinc oxide nanowires synthesized by a metal catalyzed vapor-liquid-solid process Li, SY; Lin, P; Lee, CY; Tseng, TY
國立交通大學 2014-12-08T15:39:16Z Method to improve chemical-mechanical-planarization polishing rate of low-k methyl-silsesquiazane for ultralarge scale integrated interconnect application Chang, TC; Tsai, TM; Liu, PT; Yan, ST; Chang, YC; Aoki, H; Sze, SM; Tseng, TY
國立交通大學 2014-12-08T15:39:10Z Deep depletion phenomenon of SrTiO3 gate dielectric capacitor Liu, CY; Chen, BY; Tseng, TY
國立交通大學 2014-12-08T15:38:52Z Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin films Huang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY
國立交通大學 2014-12-08T15:38:47Z Effect of atmosphere on growth of single crystal zinc oxide nanowires Li, SY; Lin, P; Lee, CY; Tseng, TY
國立交通大學 2014-12-08T15:38:41Z Dielectric characteristics of nanocrystalline Ag-Ba0.5Sr0.5TiO3 composite thin films Jayadevan, KP; Liu, CY; Tseng, TY
國立交通大學 2014-12-08T15:38:40Z Effect of Sn dopant on the properties of ZnO nanowires Li, SY; Lin, P; Lee, CY; Tseng, TY; Huang, CJ
國立交通大學 2014-12-08T15:37:21Z Fabrication of vertical ZnO nanowires on silicon(100) with epitaxial ZnO buffer layer Li, SY; Lin, P; Lee, CY; Ho, MS; Tseng, TY
國立交通大學 2014-12-08T15:37:10Z Study on etching profile of nanoporous silica Chen, CW; Chang, TC; Liu, PT; Tsai, TM; Wu, HH; Tseng, TY
國立交通大學 2014-12-08T15:37:10Z Study on the effect of electron beam curing on low-K porous organosilicate glass (OSG) material Chang, TC; Tsai, TM; Liu, PT; Chen, CW; Tseng, TY
國立交通大學 2014-12-08T15:37:10Z Cu-penetration induced breakdown mechanism for a-SiCN Chen, CW; Liu, PT; Chang, TC; Yang, JH; Tsai, TM; Wu, HH; Tseng, TY
國立交通大學 2014-12-08T15:37:06Z Effects of oxygen plasma ashing on barrier dielectric SiCN film Chen, CW; Chang, TC; Liu, PT; Tsai, TM; Tseng, TY
國立交通大學 2014-12-08T15:37:01Z Characteristics and electrochemical performance of supercapacitors with manganese oxide-carbon nanotube nanocomposite electrodes Lee, CY; Tsai, HM; Chuang, HJ; Li, SY; Lin, P; Tseng, TY
國立交通大學 2014-12-08T15:36:06Z Electrical degradation of N-channel poly-Si TFT under AC stress Chen, CW; Chang, TC; Liu, PT; Lu, HY; Tsai, TM; Weng, CF; Hu, CW; Tseng, TY
國立交通大學 2014-12-08T15:27:53Z THE INVESTIGATION OF ER-DOPED GLASSES BY 2-STEP HYDROLYSIS WITH N,N-DIMETHYL FORMAMIDE FRAN, YS; TSENG, TY; HSIEH, WF
國立交通大學 2014-12-08T15:27:38Z Luminescent properties of sol-gel prepared Y3Al5O12:Tb thin films Lo, JR; Tseng, TY; Tyan, JH; Huang, JCM
國立交通大學 2014-12-08T15:27:13Z Properties and reliability of Ta2O5 thin films deposited on Ta Ezhilvalavan, S; Tseng, TY
國立交通大學 2014-12-08T15:26:33Z A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurement Lue, HT; Tseng, TY; Huang, GW

Showing items 96-120 of 245  (10 Page(s) Totally)
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