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Showing items 1-10 of 150 (15 Page(s) Totally)
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| 國立交通大學 |
2020-10-05T02:01:56Z |
Well-behaved Ge n(+)/p shallow junction achieved by plasma immersion ion implantation
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Chen, Yi-Ju; Liao, Hsiu-Hsien; Tsui, Bing-Yue; Lee, Yao-Jen; Wang, Chih-Jen; Sung, Po-Jung |
| 國立交通大學 |
2020-10-05T02:00:30Z |
Failure Analysis on TiAl Metallization Process for Ohmic Contact on 4H-SiC pMOSFET
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Hung, Chia-Lung; Cheng, Jung-Chien; Tsui, Bing-Yue |
| 國立交通大學 |
2020-10-05T01:59:47Z |
Reduction of Contact Resistivity by Nano-Textured Contact
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Tsui, Bing-Yue; Lee, Ya-Hsin; Lee, Chen-Yi |
| 國立交通大學 |
2020-05-05T00:02:21Z |
Degradation Mechanism of Ge N+-P Shallow Junction With Thin GeSn Surface Layer
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Chen, Yi-Ju; Liao, Hsiu-Hsien; Tsui, Bing-Yue |
| 國立交通大學 |
2020-05-05T00:01:32Z |
Photon-Detection-Probability Simulation Method for CMOS Single-Photon Avalanche Diodes
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Lin, Sheng-Di; Hsiao, Bo-Jen; Tsui, Bing-Yue; Hsieh, Chin-An; Tsai, Chia-Ming |
| 國立交通大學 |
2020-04-01 |
Well-behaved 4H-SiC PMOSFET with LOCal oxidation of SiC (LOCOSiC) isolation structure and compromised gate oxide for Sub-10V SiC CMOS application
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Tsui, Bing-Yue; Hung, Chia-Lung |
| 國立交通大學 |
2020-02-02T23:55:33Z |
Thermal Stability of Shallow Ge N+-P Junction with Thin GeSn Top Layer
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Liao, Hsiu-Hsien; Chen, Yi-Ju; Tsui, Bing-Yue |
| 國立交通大學 |
2019-04-02T06:00:30Z |
High-Performance Metal-Insulator-Metal Capacitors With HfTiO/Y2O3 Stacked Dielectric
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Tsui, Bing-Yue; Hsu, Hsiao-Hsuan; Cheng, Chun-Hu |
| 國立交通大學 |
2019-04-02T05:59:58Z |
A comprehensive study on the oxidation of 4H-SiC in diluted N2O ambient
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Tseng, Yuan-Hung; Wu, Tsung-Han; Tsui, Bing-Yue; Yen, Cheng-Tyng; Hung, Chien-Chung; Lee, Chwan-Ying |
| 國立交通大學 |
2019-04-02T05:59:52Z |
High-Performance Poly-Si Nanowire Thin-Film Transistors Using the HfO2 Gate Dielectric
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Lee, Chen-Ming; Tsui, Bing-Yue |
Showing items 1-10 of 150 (15 Page(s) Totally)
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