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机构 日期 题名 作者
國立交通大學 2014-12-08T15:25:08Z Impact of back gate bias on hot-carrier effects of n-channel tri-gate FETs (TGFETs) Lin, Chia-Pin; Tsui, Bing-Yue
國立交通大學 2014-12-08T15:25:08Z Effect of oxygen absorption on contact resistance between metal and carbon nano tubes (CNTs) Tsui, Bing-Yue; Weng, Chien-Li; Chang, Chih-Lien; Wei, Jeng-Hua; Tsai, Ming-Jinn
國立交通大學 2014-12-08T15:24:27Z High Performance Metal/Insulator/Metal Capacitors Using HfTiO as Dielectric Hsu, Hsiao-Hsuan; Cheng, Chun-Hu; Tsui, Bing-Yue
國立交通大學 2014-12-08T15:20:40Z Observation of Extreme-Ultraviolet-Irradiation-Induced Damages on High-Dielectric-Constant Dielectrics Tsui, Bing-Yue; Li, Po-Hsueh; Yen, Chih-Chan
國立交通大學 2014-12-08T15:16:48Z Low threshold voltage CMOSFETs with NiSi fully silicided gate and Modified Schottky barrier source/drain junction Lin, Chia-Pin; Tsui, Bing-Yue; Hsieh, Chih-Ming; Huang, Chih-Feng
國立交通大學 2014-12-08T15:16:19Z Investigation of NiSi fully-silicided gate on SiO2 and HfO2 for applications in metal-oxide-semiconductor field-effect transistors Huang, Chih-Feng; Tsui, Bing-Yue
國立交通大學 2014-12-08T15:15:37Z Spatial and energetic distribution of border traps in the dual-layer HfO2/SiO2 high-k gate stack by low-frequency capacitance-voltage measurement Wu, Wei-Hao; Tsui, Bing-Yue; Chen, Mao-Chieh; Hou, Yong-Tian; Jin, Yin; Tao, Hun-Jan; Chen, Shih-Chang; Liang, Mong-Song
國立交通大學 2014-12-08T15:15:16Z Process and characteristics of fully silicided source/drain (FSD) thin-film transistors Lin, Chia-Pin; Hsiao, Yi-Hsuan; Tsui, Bing-Yue
國立交通大學 2014-12-08T15:13:52Z Transient charging and discharging behaviors of border traps in the dual-layer HfO2/SiO2 high-k gate stack observed by using low-frequency charge pumping method Wu, Wei-Hao; Tsui, Bing-Yue; Chen, Mao-Chieh; Hou, Yong-Tian; Jin, Yin; Tao, Hun-Jan; Chen, Shih-Chang; Liang, Mong-Song
國立交通大學 2014-12-08T15:13:40Z A process for high yield and high performance carbon nanotube field effect transistors Lee, Tseng-Chin; Tsui, Bing-Yue; Tzeng, Pei-Jer; Wang, Ching-Chiun; Tsai, Ming-Jinn

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