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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"tsui by"的相關文件
顯示項目 46-54 / 54 (共3頁)
<< < 1 2 3 > >>
每頁顯示[10|25|50]項目
| 國立交通大學 |
2014-12-08T15:05:36Z |
HIGH-TEMPERATURE STABILITY OF PLATINUM SILICIDE ASSOCIATED WITH FLUORINE IMPLANTATION
|
TSAI, JY; TSUI, BY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:05:30Z |
FORMATION AND CHARACTERIZATION OF A PTSI CONTACTED N+P SHALLOW JUNCTION
|
TSUI, BY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:05:24Z |
LOW-TEMPERATURE REACTION OF THIN-FILM PLATINUM (LESS-THAN-OR-EQUAL-TO-300A) WITH (100) SILICON
|
TSUI, BY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:05:16Z |
FORMATION OF PTSI-CONTACTED P+N SHALLOW JUNCTIONS BY BF2+ IMPLANTATION AND LOW-TEMPERATURE FURNACE ANNEALING
|
TSUI, BY; TSAI, JY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:04:48Z |
CONTACT RESISTIVITY OF SHALLOW JUNCTIONS FORMED BY IMPLANTATION THROUGH PT OR PTSI
|
TSUI, BY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:04:40Z |
SERIES RESISTANCE OF SELF-ALIGNED SILICIDED SOURCE DRAIN STRUCTURE
|
TSUI, BY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:04:40Z |
EFFECT OF FLUORINE INCORPORATION ON THE THERMAL-STABILITY OF PTSI/SI STRUCTURE
|
TSUI, BY; TSAI, JY; WU, TS; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:04:35Z |
DIELECTRIC DEGRADATION OF PT/SIO2/SI STRUCTURES DURING THERMAL ANNEALING
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TSUI, BY; CHEN, MC |
| 國立交通大學 |
2014-12-08T15:03:50Z |
ROLE OF FLUORINE-ATOMS ON THE THERMAL-STABILITY OF THE SILICIDE SILICON STRUCTURE
|
TSUI, BY; CHEN, MC |
顯示項目 46-54 / 54 (共3頁)
<< < 1 2 3 > >>
每頁顯示[10|25|50]項目
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