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Institution Date Title Author
國立交通大學 2014-12-08T15:23:37Z Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability Yuan, Jiann-Shiun; Yen, Hsuan-Der; Chen, Shuyu; Wang, Ruey-Lue; Huang, Guo-Wei; Juang, Ying-Zong; Tu, Chih-Ho; Yeh, Wen-Kuan; Ma, Jun
國立成功大學 2008-09 Degeneration of CMOS power cells after hot-carrier and load mismatch stresses Liu, Chien-Hsuan; Wang, Ruey-Lue; Su, Yan-Kuin; Tu, Chih-Ho; Juang, Ying-Zong
國立成功大學 2007-01 The optimized geometry of the SiGeHBT power cell for 802.11 a WLAN applications Lin, Chien-Hsun; Su, Yan-Kuin; Juang, Ying-Zong; Chiu, Chin-Fong; Chang, Shoou-Jinn; Chen, Jone-Fang; Tu, Chih-Ho
國立成功大學 2004-09 The effect of geometry on the noise characterization of SiGeHBTs and optimized device sizes for the design of low-noise amplifiers Lin, Chien-Hsun; Su, Yan-Kuin; Juang, Ying-Zong; Chuang, Ricky W.; Chang, Shoou-Jinn; Chen, Jone F.; Tu, Chih-Ho

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