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Showing items 11-20 of 32  (4 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:38:31Z The annealing behavior of copper deposit electroplated in sulfuric acid bath with various concentrations of thiourea Kao, YL; Tu, GC; Huang, CA; Chang, JH
國立交通大學 2014-12-08T15:37:25Z Simulation analysis and experimental verification of LIGA-like process for Ni-Fe micromold insert with taper angle Fu, MN; Yeh, YM; Tu, GC
國立交通大學 2014-12-08T15:37:01Z Microstructural study of the effect of chloride ion on electroplating of copper in cupric sulfate-sulfuric acid bath Kao, YL; Li, KC; Tu, GC; Huang, CA
國立交通大學 2014-12-08T15:19:23Z Reverse CoSi(2) thermal stability and digitized sheet resistance increase of sub-90 nm polysilicon lines Lo, CY; Peng, YC; Chen, YM; Tu, GC; Lin, SS; Chen, WM
國立交通大學 2014-12-08T15:19:05Z A study on the hardness variation of alpha- and beta-pure titanium with different grain sizes Kao, YL; Tu, GC; Huang, CA; Liu, TT
國立交通大學 2014-12-08T15:17:52Z The electrochemical polishing behavior of porous austenitic stainless steel (AISI 316L) in phosphoric-sulfuric mixed acids Chen, SC; Tu, GC; Huang, CA
國立交通大學 2014-12-08T15:17:41Z CoSix thermal stability on narrow-width polysilicon resistors Chen, YM; Tu, GC; Wang, YL; Hwang, GJ; Lo, CY
國立交通大學 2014-12-08T15:17:31Z The effect of 180 degrees C-annealing on the electrochemical behavior of nano-thick zinc-electroplated copper in aqueous solutions with different pH Kao, YL; Tu, GC; Huang, CA
國立交通大學 2014-12-08T15:17:19Z Oxide-mediated fort-nation of epitaxy silicide on heavily doped Si surfaces and narrow width active region Chen, YM; Tu, GC; Wang, YL
國立交通大學 2014-12-08T15:17:18Z Width-dependent anomalous CoSix sheet resistance change by Ti and TiN capping process Chen, YM; Tu, GC; Wang, YL

Showing items 11-20 of 32  (4 Page(s) Totally)
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