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教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
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機構 日期 題名 作者
國立交通大學 2017-04-21T06:55:29Z Communication-Formation of Porous Cu3Sn by High-Temperature Current Stressing Lin, C. K.; Chen, Chih; Chu, David T.; Tu, K. N.
國立交通大學 2017-04-21T06:49:52Z In-situ Transmission Electron Microscopy Study of Nanotwinned Copper under Electromigration Liao, Chien-Neng; Chen, Kuan-Chia; Wu, Wen-Wei; Chen, Lih-Juann; Tu, K. N.
國立交通大學 2017-04-21T06:49:40Z Electromigration in Pb-free solder bumps with Cu column as flip chip joints Nah, Jae-Woong; Suh, J. O.; Tu, K. N.; Yoon, Seung Wook; Chong, Chai Tai; Kripesh, V.; Su, B. R.; Chen, Chih
國立交通大學 2017-04-21T06:49:38Z LOW-TEMPERATURE AND LOW-PRESSURE DIRECT COPPER-TO-COPPER BONDING BY HIGHLY (111)-ORIENTED NANOTWINNED CU Chen, Chih; Liu, Chien-Min; Lin, Han-Wen; Huang, Yi-Sa; Chu, Yi-Cheng; Lyu, Dian-Rong; Chen, Kuan-Neng; Tu, K. N.
國立交通大學 2017-04-21T06:49:36Z In-situ TEM Study of Electromigration in Cu lines Liao, C. N.; Chen, K. C.; Wu, W. W.; Chen, L. J.; Tu, K. N.
國立交通大學 2017-04-21T06:48:31Z Low-temperature and low pressure copper-to-copper direct bonding enabled by creep on highly (111)-oriented Cu surfaces Tseng, Chih-Han; Liu, Chien-Min; Lin, Han-wen; Chu, Yi-Cheng; Chen, Chih; Lyu, Dian-Rong; Chen, Kuan-Neng; Tu, K. N.
國立交通大學 2017-04-21T06:48:21Z Fabrication of (111) nanotwinned Cu and its applications in interconnects of microelectronic devices Chen, Chih; Liu, Chien-Min; Lu, Tien-Lin; Lin, Han-wen; Chu, Yi-Cheng; Lu, Chia-Ling; Juang, Jing-Ye; Chen, Kuan-Neng; Tu, K. N.
國立交通大學 2015-12-02T02:59:12Z Effect of Elastic Strain Fluctuation on Atomic Layer Growth of Epitaxial Silicide in Si Nanowires by Point Contact Reactions Chou, Yi-Chia; Tang, Wei; Chiou, Chien-Jyun; Chen, Kai; Minor, Andrew M.; Tu, K. N.
國立交通大學 2014-12-08T15:48:17Z Stability of nanoscale twins in copper under electric current stressing Chen, Kuan-Chia; Wu, Wen-Wei; Liao, Chien-Neng; Chen, Lih-Juann; Tu, K. N.
國立交通大學 2014-12-08T15:48:15Z Growth of Multiple Metal/Semiconductor Nanoheterostructures through Point and Line Contact Reactions Wu, W. W.; Lu, K. C.; Wang, C. W.; Hsieh, H. Y.; Chen, S. Y.; Chou, Y. C.; Yu, S. Y.; Chen, L. J.; Tu, K. N.

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