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Showing items 1-3 of 3 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:24:48Z |
Investigation of hot carrier degradation modes in LDMOS by using a novel three-region charge pumping technique
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Cheng, C. C.; Tu, K. C.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Sam C.; Hsu, S. L. |
| 國立交通大學 |
2014-12-08T15:15:50Z |
Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping technique
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Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L. |
| 國立交通大學 |
2014-12-08T15:09:25Z |
Impact of self-heating effect on hot carrier degradation in high-voltage LDMOS
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Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L. |
Showing items 1-3 of 3 (1 Page(s) Totally)
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