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Institution Date Title Author
國立交通大學 2015-12-02T02:59:17Z Demonstration and Electrical Performance of Cu-Cu Bonding at 150 degrees C With Pd Passivation Huang, Yan-Pin; Chien, Yu-San; Tzeng, Ruoh-Ning; Chen, Kuan-Neng
國立交通大學 2014-12-12T02:32:56Z 三維積體電路之銅/銦/錫低溫接合及可靠度研究 曾若寧; Tzeng, Ruoh-Ning; 陳冠能; Chen, Kuan-Neng
國立交通大學 2014-12-08T15:35:46Z Low Temperature (< 180 degrees C) Wafer-level and Chip-level In-to-Cu and Cu-to-Cu Bonding for 3D Integration Chien, Yu-San; Huang, Yan-Pin; Tzeng, Ruoh-Ning; Shy, Ming-Shaw; Lin, Teu-Hua; Chen, Kou-Hua; Chuang, Ching-Te; Hwang, Wei; Chiou, Jin-Chern; Chiu, Chi-Tsung; Tong, Ho-Ming; Chen, Kuan-Neng
國立交通大學 2014-12-08T15:35:19Z Low-Temperature Bonded Cu/In Interconnect With High Thermal Stability for 3-D Integration Chien, Yu-San; Huang, Yan-Pin; Tzeng, Ruoh-Ning; Shy, Ming-Shaw; Lin, Teu-Hua; Chen, Kou-Hua; Chiu, Chi-Tsung; Chuang, Ching-Te; Hwang, Wei; Chiou, Jin-Chern; Tong, Ho-Ming; Chen, Kuan-Neng
國立交通大學 2014-12-08T15:35:16Z Low Temperature (< 180 degrees C) Bonding for 3D Integration Huang, Yan-Pin; Tzeng, Ruoh-Ning; Chien, Yu-San; Shy, Ming-Shaw; Lin, Teu-Hua; Chen, Kou-Hua; Chuang, Ching-Te; Hwang, Wei; Chiu, Chi-Tsung; Tong, Ho-Ming; Chen, Kuan-Neng
國立交通大學 2014-12-08T15:33:26Z Novel Cu-to-Cu Bonding With Ti Passivation at 180 degrees C in 3-D Integration Huang, Yan-Pin; Chien, Yu-San; Tzeng, Ruoh-Ning; Shy, Ming-Shaw; Lin, Teu-Hua; Chen, Kou-Hua; Chiu, Chi-Tsung; Chiou, Jin-Chern; Chuang, Ching-Te; Hwang, Wei; Tong, Ho-Ming; Chen, Kuan-Neng

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