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Taiwan Academic Institutional Repository >
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"tzeng w j"
Showing items 36-45 of 50 (5 Page(s) Totally)
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| 國立臺灣大學 |
1987 |
Degradation and Annealing Characteristics of Amorphous Silicon Hydrogen Alloys After Long Time Test
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Tzeng, W. J.; Tsai, H. K.; 李嗣涔; Tzeng, W. J.; Tsai, H. K.; Lee, Si-Chen |
| 國立臺灣大學 |
1987 |
Long-Time Repeated Photodegradation Test of Amorphous Silicon Hydrogen Alloys
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Tzeng, W. J.; Tsai, H. K.; 李嗣涔; Tzeng, W. J.; Tsai, H. K.; Lee, Si-Chen |
| 國立臺灣大學 |
1987 |
Photodegradation Kinetics of a-Si:H
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Tzeng, W. J.; 李嗣涔; Tzeng, W. J.; Lee, Si-Chen |
| 臺大學術典藏 |
1987 |
Photodegradation Kinetics of a-Si:H
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Tzeng, W. J.;李嗣涔; Tzeng, W. J.;Lee, Si-Chen; Tzeng, W. J.; 李嗣涔; Lee, Si-Chen |
| 臺大學術典藏 |
1987 |
Degradation and Annealing Characteristics of Amorphous Silicon Hydrogen Alloys After Long Time Test
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Tzeng, W. J.; Tsai, H. K.; Lee, Si-Chen; Tzeng, W. J.; Tsai, H. K.; 李嗣涔; Lee, Si-Chen |
| 國立臺灣大學 |
1986 |
Origin of Boron Contamination of Intrinsic a-Si:H in Glow Discharge
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Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Tsai, H. K.; Tzeng, W. J.; Lee, Si-Chen |
| 臺大學術典藏 |
1986 |
Origin of Boron Contamination of Intrinsic a-Si:H in Glow Discharge
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Tsai, H. K.;Tzeng, W. J.;李嗣涔; Tsai, H. K.;Tzeng, W. J.;Lee, Si-Chen; Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Lee, Si-Chen |
| 國立臺灣大學 |
1985 |
High Quality a-Si:H Prepared by Low Frequency Glow-Discharge
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Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Tsai, H. K.; Tzeng, W. J.; Lee, Si-Chen |
| 國立臺灣大學 |
1985 |
Stability of a-Si:H
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Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Hong, C. S.; Tsai, H. K.; Tzeng, W. J.; Lee, Si-Chen; Hong, C. S. |
| 臺大學術典藏 |
1985 |
High Quality a-Si:H Prepared by Low Frequency Glow-Discharge
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Tsai, H. K.;Tzeng, W. J.;李嗣涔; Tsai, H. K.;Tzeng, W. J.;Lee, Si-Chen; Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Tzeng, W. J.; Lee, Si-Chen |
Showing items 36-45 of 50 (5 Page(s) Totally)
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