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Showing items 41-50 of 50 (2 Page(s) Totally) << < 1 2 View [10|25|50] records per page
國立臺灣大學 |
1986 |
Origin of Boron Contamination of Intrinsic a-Si:H in Glow Discharge
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Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Tsai, H. K.; Tzeng, W. J.; Lee, Si-Chen |
臺大學術典藏 |
1986 |
Origin of Boron Contamination of Intrinsic a-Si:H in Glow Discharge
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Tsai, H. K.;Tzeng, W. J.;李嗣涔; Tsai, H. K.;Tzeng, W. J.;Lee, Si-Chen; Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Lee, Si-Chen |
國立臺灣大學 |
1985 |
High Quality a-Si:H Prepared by Low Frequency Glow-Discharge
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Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Tsai, H. K.; Tzeng, W. J.; Lee, Si-Chen |
國立臺灣大學 |
1985 |
Stability of a-Si:H
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Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Hong, C. S.; Tsai, H. K.; Tzeng, W. J.; Lee, Si-Chen; Hong, C. S. |
臺大學術典藏 |
1985 |
High Quality a-Si:H Prepared by Low Frequency Glow-Discharge
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Tsai, H. K.;Tzeng, W. J.;李嗣涔; Tsai, H. K.;Tzeng, W. J.;Lee, Si-Chen; Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Tzeng, W. J.; Lee, Si-Chen |
臺大學術典藏 |
1985 |
Stability of a-Si:H
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Tsai, H. K.;Tzeng, W. J.;李嗣涔;Hong, C. S.; Tsai, H. K.;Tzeng, W. J.;Lee, Si-Chen;Hong, C. S.; Tsai, H. K.; Tzeng, W. J.; 李嗣涔; Hong, C. S.; Tsai, H. K.; Lee, Si-Chen |
淡江大學 |
1912-01 |
High quality a-Si:H prepared by low frequency glow discharge
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Tzeng, W. J.; 曾文哲 ; Tsai, H. K. ; Lee, Si-chen |
淡江大學 |
1912-01 |
Long-time repeated photo-degradation test of amorphous silicon hydrogen alloys
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Tzeng, W. J.; 曾文哲 ; Tsai, H. K. ; Lee, Si-chen |
淡江大學 |
1912-01 |
Photodegradation Kinetics of a-Si:H
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Tzeng, W. J.; 曾文哲; Lee, Si-chen |
淡江大學 |
1912-01 |
Stability of a-Si:H
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Tzeng, W. J.; 曾文哲(等) |
Showing items 41-50 of 50 (2 Page(s) Totally) << < 1 2 View [10|25|50] records per page
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