臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
臺大學術典藏	2019-03-11T08:01:14Z	Sub-60mV-Swing Negative-Capacitance FinFET without Hysteresis	Chenming Hu;Sayeef Salahuddin;F. L. Yang;W. K. Yeh;J. M. Sheih;M. C. Chen;M. H. Lee;C. C. Chen;C.-C. Cheng;C. H. Lin;T. Y. Lai;P.-G. Chen;K. S. Li;M. H.Liao; M. H.Liao; K. S. Li; P.-G. Chen; T. Y. Lai; C. H. Lin; C.-C. Cheng; C. C. Chen; M. H. Lee; M. C. Chen; J. M. Sheih; W. K. Yeh; F. L. Yang; Sayeef Salahuddin; Chenming Hu
國立高雄師範大學	2012	RF Stress Effects on CMOS LC-Loaded VCO Reliability Evaluated by Experiments	Ruey-Lue Wang;H. D. Yen;J. S. Yuan;Y. Y. Zhang;G. W. Huang;W. K. Yeh;F. S. Huang; 王瑞祿
國立高雄師範大學	2012	Experimental Verification of RF Stress Effect on Cascode Class E PA Performance and Reliability	Ruey-Lue Wang;J. S. Yuan;H. D. Yen;S. Chen;R. L. Wang;G. W. Huang;Y. Z. Juang;C. H. Tu;W. K. Yeh;J. Ma; 王瑞祿
國立高雄師範大學	2011-11	Reliability Improvement of 28nm Gate Last High-k/Metal Gate Device with Oxygen Annealing	Y.L. Yang;Y.P. Huang;P.T. Chen;W.Q. Zhang;C.Y. Cheng;L.K. Chin;C.W. Hsu;W.K. Yeh; 楊宜霖
國立高雄師範大學	2011-10	A Proposed High Manufacturability Strain Technology for High-k/Metal Gate SiGe-SOI CMOSFET	W.K. Yeh;C.Y. Cheng;Y.L Yang;C.T. Lin;C.M. Lai;Y.W. Chen;C. H. Hsu;C.W. Yang;P.Y. Chen; 楊宜霖
國立中山大學	2003	A framework and applications of integrating IC cards and campus information systems	T.P. Hong ; A.C. Tseng ; W.Y. Chiu ; Y.T. Chang-Chien ; H.C. Chang ; W.K. Yeh

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