English  |  正體中文  |  简体中文  |  2823025  
???header.visitor??? :  30290484    ???header.onlineuser??? :  903
???header.sponsordeclaration???
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
???ui.leftmenu.abouttair???

???ui.leftmenu.bartitle???

???index.news???

???ui.leftmenu.copyrighttitle???

???ui.leftmenu.link???

"w t hsieh"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1??? ???jsp.browse.items-by-author.order2???

Showing items 16-40 of 57  (3 Page(s) Totally)
1 2 3 > >>
View [10|25|50] records per page

Institution Date Title Author
南台科技大學 2002-05 Downscaling limit of equivalent oxide thickness in formation ofultrathin gate dielectric by thermal-enhanced remote plasma nitridation C. H. Chen; Y. K. Fang; S. F. Ting; W. T. Hsieh; C. W. Yang; T. H. Hsu; M. C. Yu; T. L. Lee; S. C. Chen; C. H. Yu; M. S. Liang;陳順智;謝文哲
南台科技大學 2002-03 A High Breakdown-Voltage SiCN/Si Heterojunction Diode for High-Temperature Applications S. F. Ting; Y. K. Fang; W. T. Hsieh; Y. S. Tsair; C. N. Chang; C. S. Lin; M. C. Hsieh; H. C. Chiang; J. J. Ho;謝文哲
南台科技大學 2002 Improving the high-temperature performances of SiC-on-Si photodetectors by use of porous-silicon semi-insulating substrates 吳坤憲; K. H. Wu; M. H. Hung; W. T. Hsieh
南台科技大學 2001-10 Originals and effects of radical-induced re-oxidation in ultra-thin remote plasma nitrided oxides C. H. Chen; Y. K. Fang; W. T. Hsieh; S. F. Ting; M. C. Yu; M. F. Wang; C. L. Chen; L. G. Yao; S. C. Chen; C. H. Yu; M. S. Liang;陳順智;謝文哲
南台科技大學 2001-09 The Cubic Single-Crystalline Si1-x-yCxNy Films With Mirror Face Prepared By RTCVD S. F. Ting; Y. K. Fang; W. T. Hsieh; Y. S. Tsair; C. N. Chang; C. S. Lin; M. C. Hsieh; H. C. Chiang; J. J. Ho;謝文哲
南台科技大學 2001-07 The Effect of Remote Plasma Nitridation on the Integrity of the Ultrathin Gate Dielectric Films in 0. 13mm CMOS Technology and Beyond S. F. Ting; Y. K. Fang; C. H. Chen; C. W. Yang; W. T. Hsieh; J. J. Ho; M. C. Yu; S. M. Jang; C. H. Yu; M. S. Liang; S. Chen; R. Shih;謝文哲
國立臺灣海洋大學 2001-07 The Effect of Remote Plasma Nitridation on the Integrity of the Ultrathin Gate Dielectric Films in 0.13 m CMOS Technology and Beyond S.F. Ting; Y.K. Fang; C.H. Chen; C.W. Yang; W.T. Hsieh; J.J. Ho; M.C. Yu; S.M. Jang; C.H. Yu; M.S. Liang; S. Chen; R. Shih
國立臺灣海洋大學 2001-04 Using Porous Silicon As Semi-Insulating Substrate for a-SiC High Temperature Optical-Sensing Devices W.T. Hsieh; Y.K. Fang; K.H. Wu; W.J. Lee; J.J. Ho; C.W. Ho
南台科技大學 2001-02 Using Porous Silicon As Semi-Insulating Subsrate for β-SiC High Temperature Optical-Sensing Devices W. T. Hsieh; Y. K. Fang; K. H. Wu; W. J. Lee; J. J. Ho; C. W. Ho;謝文哲
南台科技大學 2001 Using porous silicon as semi-insulating substrate for β-SiChigh temperature optical-sensing devices 吳坤憲; W. T. Hsieh; Y. K. Fang; K. H. Wu; W. J. lee; J. J. Ho; C. W. Ho
國立臺灣海洋大學 2000-10-26 To Suppress Dark Current of High Temperature -SiC/Si Optoelectronic Devices with Porous Silicon W.T. Hsieh; Y.K. Fang; W.J. Lee; K.H. Wu; J.J. Ho; K.H. Chen; S.Y. Huang
國立臺灣海洋大學 2000-05 An a-SiGeH Phototransistor Integrated a Pd Film on Glass Substrate for Hydrogen Monitoring W.T. Hsieh; Y.K. Fang; W.J. Lee; K.H. Wu; J.J. Ho; K.H. Chen; S.Y. Huang
國立臺灣海洋大學 2000-05 An a-SiGeH Phototransistor Integrated a Pd Film on Glass Substrate for Hydrogen Monitoring W.T. Hsieh; Y.K. Fang; W.J. Lee; K.H. Wu; J.J. Ho; K.H. Chen; S.Y. Huang
南台科技大學 2000-02 Effects of Surface Porosity on Tungsten Trioxide(WO3) Films’ Electrochromic Performance W. J. Lee; Y. K. Fang; J. J. Ho; W. T. Hsieh; S. F. Ting; Daoyang Huang; Fang C. Ho;謝文哲
國立臺灣海洋大學 2000-02 Effects of Surface Porosity on Tungsten Trioxide (WO3) Films’Electrochromic Performance W. J. Lee; Y. K. Fang; Jyh-Jier Ho; W. T. Hsieh; S. F. Ting; Daoyang Huang; Fang C. Ho
國立臺灣海洋大學 2000-01-06 Improvement of beta-SiC/Si pn Diode High Temperature Characteristics with Porous Silicon Layer W.T. Hsieh; Y.K. Fang; W.J. Lee; C.W. Ho; K.H. Wu; J.J. Ho; J.D. Hwang
南台科技大學 2000-01 Improvement of β-SiC / Si pn diode high temperature characteristics with porous silicon laye W. T. Hsieh; Y. K. Fang; W. J Lee; C. W. Ho; K. H. Wu; J. J. Ho; J. D. Hwang;謝文哲
南台科技大學 2000 To suppress dark current of high temperature β-SiC/Sioptoelectronic devices with porous silicon substrate 吳坤憲; W. T. Hsieh; Y. K. Fang; W. J. Lee; C. W. Ho; K. H. Wu
南台科技大學 2000 Improvement of β-SiC/Si pn diode high temperature characteristics with porous silicon layer 吳坤憲; W. T. Hsieh; Y. K. Fang; W. J. Lee; C. W. Ho; K. H. Wu; J. J. Ho; J. D. Hwang
南台科技大學 2000 To suppress dark current of high temperature β-SiC/Sioptoelectronic devices with porous silicon substrate 吳坤憲; W. T. Hsieh; Y. K. Fang; K. H. Wu; W. J. lee; J. J. Ho; C. W. Ho
南台科技大學 1999-12 The Dynamic Response Analysis of a Pyroelectric Thin-Film Infrared Sensor with Thermal Isolation Improvement Structure J.J. Ho; Y. K. Fang; W. J. Lee; F. Y. Chen; W. T. Hsieh; S. F. Ting; K. H. Lee; M. S. Ju; S. B. Huang; K. H. Wu; C. Y. Chen;謝文哲;林福林
國立臺灣海洋大學 1999-12 The Dynamic Response Analysis of a Pyroelectric Thin-film Infrared Sensor with Thermal Isolation Improvement Structure Jyh-Jier Ho; Y.K. Fang; W.J. Lee; F.Y. Chen; W.T. Hsieh; S.F. Ting; M.S. Ju; M.S. Ju; S.B. Huang; K.H. Wu; C.Y. Chen
南台科技大學 1999-10 Analysis of Substrate Effects on the Response of Pyroelectric Thin-Film Infrared Sensors J. J. Ho; Y. K. Fang; W. J. Lee; F. Y. Chen; W. T. Hsieh; S. F. Ting; K. H. Lee; M. C. Hsieh; C. P. Chang; K. H. Wu;謝文哲;林福林
南台科技大學 1999-08 A Novel SiC/Si Heterojunction Diode with High-Temperature Bidirectional N-Shaped Negative-Differential-Resistances for High-Temperature Applications K.H. Wu; Y. K. Fang; J.J. Ho; W.T. Hsieh; T.J. Chen;謝文哲;吳坤憲
國立臺灣海洋大學 1998-11-12 High-responsivity porous-SiC thin-film pn junction photodetector K.H. Wu; Y.K. Fang; W.T. Hsieh; Jyh-Jier Ho; W.J. Lin; J.D. Hwang

Showing items 16-40 of 57  (3 Page(s) Totally)
1 2 3 > >>
View [10|25|50] records per page