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"wang bo chin"
Showing items 1-18 of 18 (1 Page(s) Totally)
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| 國立成功大學 |
2016-01 |
Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Wang, Bo-Chin; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2015-09-10 |
Investigation of Low-Frequency Noise in High-k First/Metal Gate Last HfO2 and ZrO2 nMOSFETs
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Wu, San-Lein; Wang, Bo Chin; Lu, Yu-Ying; Tsai, Shih-Chang; Chen, Jone-Fang; Chang, Shoou-Jinn; Chang, Sheng-Po; Hsu, Che-Hua; Yang, Chih Wei; Chen, Cheng-Guo; Cheng, Osbert; Huang, Po-Chin |
| 國立成功大學 |
2014-11 |
Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors
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Liu, Chung-Wei; Chang, Shoou-Jinn; Hsiao, Chih-Hung; Lo, Kuang-Yao; Kao, Tsung-Hsien; Wang, Bo-Chin; Young, Sheng-Joue; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2014-09 |
Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High-k/Metal Gate pMOSFETs
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Kao, Tsung-Hsien; Wu, San-Lein; Wu, Chung-Yi; Fang, Yean-Kuen; Wang, Bo-Chin; Huang, Po Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-08 |
Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
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Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang |
| 國立成功大學 |
2014-07-01 |
Novel Ga-ZnO Nanosheet Structures Applied in Ultraviolet Photodetectors
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Yang, Chih-Chiang; Su, Yan-Kuin; Hsiao, Chih-Hung; Young, Sheng-Joue; Kao, Tsung-Hsien; Chuang, Ming-Yueh; Huang, Yu-Chun; Wang, Bo-Chin; Wu, San-Lein |
| 國立成功大學 |
2014-03 |
ZnO-Based Ultraviolet Photodetectors With Novel Nanosheet Structures
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Young, Sheng-Joue; Liu, Yi-Hsing; Hsiao, Chih-Hung; Chang, Shoou-Jinn; Wang, Bo-Chin; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2014 |
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
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Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen |
| 國立成功大學 |
2013-11-01 |
Low-Frequency Noise Characteristics of In-Doped ZnO Ultraviolet Photodetectors
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Chang, Shoou-Jinn; Duan, Bi-Gui; Hsiao, Chih-Hung; Young, Sheng-Joue; Wang, Bo-Chin; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2013-07-16 |
低頻雜訊對先進CMOS元件缺陷之研究
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王柏清; Wang, Bo-Chin |
| 國立成功大學 |
2013-07 |
Low-Frequency Noise Characteristics for Various ZrO2-Added HfO2-Based 28-nm High-k/Metal-Gate nMOSFETs
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Tsai, Shih Chang; Wu, San Lein; Wang, Bo Chin; Chang, Shoou Jinn; Hsu, Che Hua; Yang, Chih Wei; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert; Huang, Po Chin; Chen, Jone F. |
| 國立成功大學 |
2013-06-14 |
低頻雜訊對先進CMOS元件缺陷之研究
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王柏清; Wang, Bo-Chin |
| 國立成功大學 |
2013-04 |
Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
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Wang, Bo-Chin; Wu, San-Lein; Lu, Yu-Ying; Huang, Chien-Wei; Wu, Chung-Yi; Lin, Yu-Min; Lee, Kun-Hsien; Cheng, Osbert; Huang, Po-Chin; Chang, Shoou-Jinn |
| 國立成功大學 |
2013-03 |
One Step Fabrication of Low Noise CuO Nanowire-Bridge Gas Sensor
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Wang, Sheng-Bo; Hsiao, Chih-Hung; Hung, Shang-Chao; Chang, Shoou-Jinn; Young, Sheng-Joue; Wang, Bo-Chin; Wu, San-Lein; Huang, Bohr-Ran; Han, Hsieh-Cheng |
| 國立成功大學 |
2013-02-01 |
Comparison of the Trap Behavior Between ZrO2 and HfO2 Gate Stack nMOSFETs by 1/f Noise and Random Telegraph Noise
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Wang, Bo Chin; Wu, San Lein; Lu, Yu Ying; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Yang, Chih Wei; Chen, Cheng Guo; Cheng, Osbert; Huang, Po Chin |
| 國立成功大學 |
2012-07 |
Correlation Between Random Telegraph Noise and 1/f Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2012-02 |
Characterization of Oxide Tarps in 28 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2009-04 |
Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
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Huang, Po-Chin; Kang, Ting-Kuo; Wang, Bo-Chin; Wu, San-Lein; Chang, Shoou-Jinn |
Showing items 1-18 of 18 (1 Page(s) Totally)
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