|
English
|
正體中文
|
简体中文
|
2809385
|
|
???header.visitor??? :
26974295
???header.onlineuser??? :
459
???header.sponsordeclaration???
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"wang pin yao"???jsp.browse.items-by-author.description???
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2018-08-21T05:53:13Z |
Evaluation of the Role of Deep Trap State Using Analytical Model in the Program/Erase Cycling of NAND Flash Memory and Its Process Dependence
|
Yang, Bo-Jun; Wu, Yu-Ting; Chiu, Yung-Yueh; Kuo, Tse-Mien; Chang, Jung-Ho; Wang, Pin-Yao; Shirota, Riichiro |
國立交通大學 |
2015-07-21T08:29:05Z |
New Method to Analyze the Shift of Floating Gate Charge and Generated Tunnel Oxide Trapped Charge Profile in NAND Flash Memory by Program/Erase Endurance
|
Shirota, Riichiro; Yang, Bo-Jun; Chiu, Yung-Yueh; Chen, Hsuan-Tse; Ng, Seng-Fei; Wang, Pin-Yao; Chang, Jung-Ho; Kurachi, Ikuo |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
|