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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
臺大學術典藏 |
2022-02-21T23:31:00Z |
Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization
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Wu, Mu Ting; Kuo, Cheng Sian; Li, James Chien Mo; Nigh, Chris; Bhargava, Gaurav |
臺大學術典藏 |
2021-01-19T12:08:37Z |
Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips
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Liu, Chih Yan; Wu, Mu Ting; Li, James C.M.; Bhargava, Gaurav; Nigh, Chris |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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