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Showing items 31-44 of 44 (2 Page(s) Totally)
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| 淡江大學 |
2010-09 |
Optimal Test Access Mechanism (TAM) for Reducing Test Application Time of Core-Based SOCs
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Rau, Jiann-Chyi; Wu, Po-han; Huang, Wnag-Tiao; Chien, Chih-Lung; Chen, Chien-Shiun |
| 淡江大學 |
2010-05-30 |
Multi-Chains Encoding Scheme in Low-Cost ATE
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饒建奇; Rau, Jiann-Chyi; Chen, Gong-Han; Wu, Po-Han |
| 淡江大學 |
2010-05-30 |
Multi-Cycle Compress Technique for High-Speed IP in Low-Cost Environment
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饒建奇; Rau, Jiann-Chyi; Lin, Chu-Chuan; Wu, Po-Han; Chen, Gong-Han |
| 淡江大學 |
2009-11-23 |
A New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology
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Chen, Tsung-tang; Li, Wei-lin; Wu, Po-han; Rau, Jiann-chyi |
| 淡江大學 |
2009-11 |
Low Power Multi-Chains Encoding Scheme for SoC in Low-Cost Environment
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Wu, Po-han; Rau, Jiann-chyi |
| 淡江大學 |
2009-05-24 |
Reducing Switching Activity by Test Slice Difference Technique for Test Volume Compression
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Li, Wei-Lin; Wu, Po-Han; Rau, Jiann-Chyi |
| 淡江大學 |
2009-01 |
The Star-Routing Algorithm Based on Manhattan-Diagonal Model for Three Layers Channel Routing
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Rau, Jiann-chyi; Wu, Po-han; Liu, Chia-jung; Lin, Yi-chen |
| 淡江大學 |
2008-11 |
The Efficient TAM Design for Core-Based SOCs Testing
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Rau, Jiann-chyi; Wu, Po-han; Chien, Chih-lung; Wu, Chien-hsu |
| 國立成功大學 |
2008-09 |
Knowledge verification for fuzzy expert systems
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Wu, Po-Han; Hwang, Gwo-Haur; Liu, Hsiang-Ming; Hwang, Gwo-Jen; Tseng, Judy C. R.; Huang, Yueh-Min |
| 淡江大學 |
2008-06 |
A Novel Reseeding Mechanism for Improving Pseudo-Random Testing of VLSI Circuits
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Rau, Jiann-chyi; Wu, Po-han; Ho, Ying-fu |
| 淡江大學 |
2008-06 |
An Efficient Scheduling Algorithm Based On Multi-frequency TAM for SOC Testing
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Rau, Jiann-chyi; Wu, Po-han; Ma, Jia-shing |
| 淡江大學 |
2006-12-04 |
Design of Dynamically Assignmentable TAM Width for Testing Core-Based SOCs
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Rau, Jiann-Chyi; Chen, Chien-Shiun; Wu, Po-Han |
| 淡江大學 |
2006 |
A novel hardware architecture for low power and rapid testing of VLSI circuits
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吳柏翰; Wu, Po-han |
| 淡江大學 |
2005-05-23 |
A novel reseeding mechanism for pseudo-random testing of VLSI circuits
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Rau, Jiann-chyi; Ho, Ying-fu; Wu, Po-han |
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