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Showing items 11-35 of 68 (3 Page(s) Totally)
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| 國立交通大學 |
2015-11-26T01:04:02Z |
氮化鎵磊晶層之奈米機械特性與陰極螢光分析
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林孟泓; Lin, Meng-Hung; 周長彬; 吳文發; Chou, Chang-Pin; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T02:31:12Z |
電漿處理鉭,鈦及鉿基擴散阻障層於銅金屬化製程之研究
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歐耿良; Ou Keng-Liang; 周長彬; 吳文發; Chou Chang-Pin; Wu Wen-Fa |
| 國立交通大學 |
2014-12-12T02:19:24Z |
鈦或氮化鈦底層與氧成分對金屬化製程之氮化鈦結構與性質的影響
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黃麒銓; Huang, Chyi-Chyuan; 林健正; 吳文發; Ling, Chien-Cheng; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T02:12:48Z |
射頻磁控濺鍍之氧化銦錫薄膜與披覆抗反射耐磨耗覆層之氧化銦錫薄膜
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吳文發; Wu, Wen Fa; 邱碧秀; Qiu, Bi Xiu |
| 國立交通大學 |
2014-12-12T01:48:10Z |
利用田口-灰關聯法探討以無電鍍沉積合成大面積矽奈米線陣列與其應用
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邱薆蕙; Chiou,Ai-Huei; 周長彬; 吳文發; Chou, Chang-Pin; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:48:10Z |
熱處理對矽鍺磊晶薄膜奈米磨耗特性之影響
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吳明璋; Wu, Ming-Jhang; 周長彬; 吳文發; Chou, Chang-Pin; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:37:15Z |
具摻雜析離層蕭特基SONOS之元件製作與特性分析
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張民尚; Chang, Ming-Shang; 邱碧秀; 吳文發; Chiou, Bi-Shiou; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:37:15Z |
運用非晶化離子佈植與鐿介層調變矽化鎳之蕭特基能障高度
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李肇中; Lee, Chao-Chung; 邱碧秀; 吳文發; Chiou, Bi-Shiou; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:28:26Z |
奈米碳管結合栓塞結構於電漿處理後覆蓋銅金屬之特性研究
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王凱億; Wang, Kai-Yi; 周長彬; 吳文發; Chou, Chang-Ping; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:28:23Z |
矽鍺異質接面結構退火效應與奈米機械特性之研究
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李其澧; Li, Chi-Li; 周長彬; 吳文發; Chou, Chang-Ping; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:24:49Z |
熱處理對於磊晶矽鍺薄膜材料及機械特性之影響
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何柏青; He, Ching-Bo; 周長彬; 吳文發; Chou, Chang-Pin; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-12T01:22:47Z |
常壓電漿技術應用於表面聲波生物感測器及燃料轉換之研究
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張佑銘; Chang, Yo-Ming; 周長彬; 吳文發; Chou, Chang-Pin; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-08T15:48:37Z |
Evaluating the abrasive wear of Zn(1-x)Mn(x)O heteroepitaxial layers using a nanoscratch technique
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Chang, Yu-Ming; Wen, Hua-Chiang; Yang, Chu-Shou; Lian, Derming; Tsai, Chien-Huang; Wang, Jyh-Shyang; Wu, Wen-Fa; Chou, Chang-Pin |
| 國立交通大學 |
2014-12-08T15:48:37Z |
Effect of Nitrogen Plasma Treatment on Electrical Characteristics for Pd Nanocrystals in Nonvolatile Memory
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Kang, Tsung-Kuei; Liao, Ta-Chuan; Lin, Cheng-Li; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-08T15:48:05Z |
Nanoscratch study of Zn(1-x)Mn(x)O heteroepitaxial layers
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Chang, Yu-Ming; Chang, Zue-Chin; Lian, Derming; Yang, Chu-Shou; Yau, Wei-Hung; Tsai, Chien-Huang; Wu, Wen-Fa; Chou, Chang-Pin |
| 國立交通大學 |
2014-12-08T15:44:54Z |
Dielectric anisotropy in the integration of Cu-SiLK (TM) system
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Tseng, Hal-Sin; Chiou, Bi-Shiou; Wu, Wen-Fa; Ho, Chia-Cheng |
| 國立交通大學 |
2014-12-08T15:33:06Z |
The use of the grey-Taguchi method for the optimization of a silicon nanowires array synthesized using electroless Ag-assisted etching
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Chiou, Ai-Huei; Wu, Wen-Fa; Chen, Ding-Yeng; Hsu, Chun-Yao |
| 國立交通大學 |
2014-12-08T15:32:14Z |
Nanowire Field Effect Transistor With its Sub-picomolar Label-free Biosensing Capability Toward a Gene Mutation
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Wu, Chi-Chang; Ko, Fu-Hsiang; Su, Ting-Siang; Li, Bo-Syuan; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-08T15:31:15Z |
Improved characteristics for Pd nanocrystal memory with stacked HfAlO-SiO(2) tunnel layer
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Kang, Tsung-Kuei; Liu, Han-Wen; Wang, Fang-Hsing; Lin, Cheng-Li; Liao, Ta-Chuan; Wu, Wen-Fa |
| 國立交通大學 |
2014-12-08T15:28:03Z |
Nanomechanical characteristics of annealed Si/SiGe superlattices
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Wu, Ming-Jhang; Wen, Hua-Chiang; Wu, Shyh-Chi; Yang, Ping-Feng; Lai, Yi-Shao; Hsu, Wen-Kuang; Wu, Wen-Fa; Chou, Chang-Pin |
| 國立交通大學 |
2014-12-08T15:22:44Z |
Induced NH2 bonding of carbon nanotubes using NH3 plasma-enhanced chemical vapor deposition
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Chiou, Ai-Huei; Chang, Yu-Ming; Wu, Wen-Fa; Chou, Chang-Ping; Hsu, Chun-Yao |
| 國立交通大學 |
2014-12-08T15:21:38Z |
Evaluating nanotribological behavior of annealing Si(0.8)Ge(0.2)/Si films
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Wu, Ming-Jhang; Wen, Hua-Chiang; Wu, Shyh-Chi; Yang, Ping-Feng; Lai, Yi-Shao; Hsu, Wen-Kuang; Wu, Wen-Fa; Chou, Chang-Pin |
| 國立交通大學 |
2014-12-08T15:16:29Z |
Repairing of etching-induced damage of high-k Ba0.5Sr0.5TiO3 thin films by oxygen surface plasma treatment
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Tsai, Kou-Chiang; Wu, Wen-Fa; Chao, Chuen-Guang; Lee, Jain-Tsai; Hsu, Jwo-Lun |
| 國立交通大學 |
2014-12-08T15:16:29Z |
Improving electrical properties and thermal stability of (Ba,Sr)TiO3 thin films on Cu(Mg) bottom electrodes
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Tsai, Kou-Chiang; Wu, Wen-Fa; Chao, Chuen-Guang; Lee, Jain-Tsai; Shen, Shih-Wen |
| 國立交通大學 |
2014-12-08T15:16:19Z |
Influence of bias-temperature stressing on the electrical characteristics of SiOC : H film with Cu/TaN/Ta-gated capacitor
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Tsai, Kou-Chiang; Wu, Wen-Fa; Chao, Chuen-Guang |
Showing items 11-35 of 68 (3 Page(s) Totally)
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