臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	Repositories
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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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	機構典藏計畫網站
	ROAR
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	臺大學術典藏NTU Scholars

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T09:50:52Z	On guaranteeing capture safety in at-speed scan testing with broadcast-scan-based test compression	K. Enokimoto;X. Wen;K. Miyase;J.-L. Huang;S. Kajihara;L.-T. Wang; K. Enokimoto; X. Wen; K. Miyase; J.-L. Huang; S. Kajihara; L.-T. Wang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:50:52Z	On guaranteeing capture safety in at-speed scan testing with broadcast-scan-based test compression	K. Enokimoto;X. Wen;K. Miyase;J.-L. Huang;S. Kajihara;L.-T. Wang; K. Enokimoto; X. Wen; K. Miyase; J.-L. Huang; S. Kajihara; L.-T. Wang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:31Z	Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,	S. Wu;L. T. Wang;X. Wen;W. B. Jone;M. S. Hsiao;F. Li;J. C. M. Li;J. L. Huang; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:31Z	Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,	S. Wu;L. T. Wang;X. Wen;W. B. Jone;M. S. Hsiao;F. Li;J. C. M. Li;J. L. Huang; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	A transition isolation scan cell design for low shift and capture power	Y.-T. Lin;J.-L. Huang;X. Wen; Y.-T. Lin; J.-L. Huang; X. Wen; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	A transition isolation scan cell design for low shift and capture power	Y.-T. Lin;J.-L. Huang;X. Wen; Y.-T. Lin; J.-L. Huang; X. Wen; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T08:47:22Z	Clock-Gating-Aware Low Launch WSA Test Pattern Generation for At-Speed Scan Testing	Y.-T. Lin; J.-L. Huang; X. Wen; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment	M.-F. Wu;J.-L. Huang;X. Wen;K. Miyase; M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment	M.-F. Wu;J.-L. Huang;X. Wen;K. Miyase; M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:09:28Z	Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Testing	M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG

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