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Institution Date Title Author
國立交通大學 2014-12-08T15:04:20Z EXPERIMENTAL COMPARISON OF OFF-STATE CURRENT BETWEEN HIGH-TEMPERATURE-PROCESSED AND LOW-TEMPERATURE-PROCESSED UNDOPED CHANNEL POLYSILICON THIN-FILM TRANSISTORS YEH, CF; YANG, TZ; CHEN, CL; CHEN, TJ; YANG, YC
國立交通大學 2014-12-08T15:04:07Z PERFORMANCE AND OFF-STATE CURRENT MECHANISMS OF LOW-TEMPERATURE PROCESSED POLYSILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITED SIO2 GATE INSULATOR YEH, CF; LIN, SS; YANG, TZ; CHEN, CL; YANG, YC
國立交通大學 2014-12-08T15:04:04Z LOW-TEMPERATURE-PROCESSED POLY-SI THIN-FILM TRANSISTORS USING SOLID-PHASE-CRYSTALLIZED AND LIQUID-PHASE-DEPOSITED GATE OXIDE YEH, CF; CHEN, CL; YANG, YC; LIN, SS; YANG, TZ; HONG, TY
國立交通大學 2014-12-08T15:03:33Z CHARACTERISTICS OF SELF-INDUCED LIGHTLY-DOPED-DRAIN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS WITH LIQUID-PHASE DEPOSITION SIO2 AS GATE-INSULATOR AND PASSIVATION-LAYER YEH, CF; YANG, TZ; CHEN, TJ

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