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Institution	Date	Title	Author
臺大學術典藏	2020-04-28T07:12:33Z	Micro-system displacement and profile measurement by an integrated photon tunneling and confocal microscope	Chen, W.-J.; Huang, L.-S.; Lee, C.-K.; Chu, T.-S.; Yeh, W.-F.; Lu, S.-S.; Cheng, Y.-C.; CHIH-KUNG LEE

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