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Showing items 31-33 of 33 (2 Page(s) Totally)
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| 國立高雄大學 |
2009-11 |
Impact of Oxide Trap Charge on Performance of Strained Fully Depleted SOI Metal-Gate MOSFET
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Yeh, W.K.; Wang, C.C.; Hsu, C.W.; Fang, Y.K.; Wu, S.M.; Ou, C.C.; Lin, C.L.; Gan, K.J.; Weng, C.J.; Chen, P.Y.; Yuan, J.S.; Liou, J.J. |
| 國立高雄大學 |
2007 |
Efficient Transistor Optimization with Stress Enhanced Notch-gate Technology for sub-90nm CMOSFET
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Yeh, W.K. ; Hsu, C.W. ; Lai, C.M. ; Lin, C.T. ; Fang, Y.K. ; Hsu, C.H. ; Chen, L.W. ; Huang, Y.T. ; Tsai, C.T. |
| 國立高雄大學 |
2005 |
The impact of mobility modulation technology on device performance and reliability for sub-90nm SOI MOSFETs
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Yeh, W.K. ; Lai, C.M. ; Lin, C.T. ; Fang, Y.K. ; Hu, H.H. ; Chen, K.M. ; Huang, G.W. |
Showing items 31-33 of 33 (2 Page(s) Totally)
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