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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:27:41Z |
Low temperature processed poly-Si thin-film transistors with thinner LPD-SiO2 as gate insulator and its reliability
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Fan, CL; Yeh, CF; Tsai, HK; Lur, W; Yen, PW |
| 國立交通大學 |
2014-12-08T15:04:21Z |
NOVEL PHENOMENON OF THE AL-1 WT-PERCENT-SI CONTACTS ON THE NF3/AR POST-ETCHING-TREATED N-SI SUBSTRATES
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CHENG, HC; CHEN, YE; JUANG, MH; YEN, PW; LIN, L |
| 國立交通大學 |
2014-12-08T15:03:31Z |
BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING
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YEH, CF; CHEN, CL; LUR, W; YEN, PW |
| 臺北醫學大學 |
2010 |
Binding and cleavage of E
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Liao, JH;Lin, YC;Hsu, J;Lee, AY;Chen, TA;Hsu, CH;Chir, JL;Hua, KF;Wu, TH;Hong, LJ;Yen, PW;Chiou, A;Wu, SH |
Showing items 1-4 of 4 (1 Page(s) Totally)
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