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| 國立交通大學 |
2018-08-21T05:54:10Z |
Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO2 Layer in p-MOSFETs
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Lu, Ying-Hsin; Chang, Ting-Chang; Liao, Jih-Chien; Chen, Li-Hui; Lin, Yu-Shan; Chen, Ching-En; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-Yu; Lien, Chen-Hsin; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting |
| 國立交通大學 |
2017-04-21T06:56:20Z |
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors
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Lu, Ying-Hsin; Chang, Ting-Chang; Ho, Szu-Han; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting |
| 國立成功大學 |
2016-12 |
Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal-oxide-semiconductor field effect transistors
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Lu, Ying-Hsin; Chang, Ting-Chang; Ho, Szu-Han; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting |
| 國立臺灣大學 |
2010 |
沒有變革的改革－全球化與台灣金融監理改革
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顏維婷; Yen, Wei-Ting |
| 中原大學 |
2006-06 |
同時進行運算排序及運算時間選擇以最小化週期與週期間的功率差異 Simultaneous Operation Scheduling and Operation Delay Selection for Minimizing Cycle-By-Cycle Power Differential
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Yen, Wei-Ting;Huang, Shih-Hsu;Cheng, Chun-Hua |
| 大葉大學 |
2003 |
Light-Induced Structural Changes in Hydrogenated Amorphous Silicon (a-Si:H)
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Lee, Ming-San;Yen, Wei-Ting;Tseng, Chih-Feng;Chen, Mu-Song;Chang, Yung-Ping;Lee, Shihfong |
Showing items 1-6 of 6 (1 Page(s) Totally)
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