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Institution Date Title Author
國立交通大學 2019-04-03T06:39:54Z High Performance Metal-Gate/High-kappa GaN MOSFET With Good Reliability for Both Logic and Power Applications Yi, Shih-Han; Ruan, Dun-Bao; Di, Shaoyan; Liu, Xiaoyan; Wu, Yung Hsien; Chin, Albert
國立交通大學 2015-12-02T03:00:50Z High Performance n(+)/p Junction Technology for High Mobility Ge nMOSFET Chin, Albert; Yi, Shih-Han

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