|
English
|
正體中文
|
简体中文
|
2823024
|
|
???header.visitor??? :
30229294
???header.onlineuser??? :
918
???header.sponsordeclaration???
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"yu m a"???jsp.browse.items-by-author.description???
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
臺大學術典藏 |
2019-03-11T08:01:09Z |
Publisher's note: "Optimization of dislocation edge stress effects for Si N-type metal-oxide-semiconductor field-effect transistors" [Jpn. J. Appl. Phys. 52, 04CC20 (2013)]
|
Kao, S.-C.;Liu, G.-H.;Yu, M.-A.;Yang, C.;Chang, L.-C.;Chen, C.-H.;Liao, M.-H.; Liao, M.-H.; Chen, C.-H.; Chang, L.-C.; Yang, C.; Yu, M.-A.; Liu, G.-H.; Kao, S.-C. |
臺大學術典藏 |
2019-03-11T08:01:09Z |
Publisher's note: "Optimization of dislocation edge stress effects for Si N-type metal-oxide-semiconductor field-effect transistors" [Jpn. J. Appl. Phys. 52, 04CC20 (2013)]
|
Kao, S.-C.;Liu, G.-H.;Yu, M.-A.;Yang, C.;Chang, L.-C.;Chen, C.-H.;Liao, M.-H.; Liao, M.-H.; Chen, C.-H.; Chang, L.-C.; Yang, C.; Yu, M.-A.; Liu, G.-H.; Kao, S.-C. |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
|