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机构 日期 题名 作者
國立成功大學 2022-01 Lab-scale characterization and semi-field trials of Wolbachia Strain wAlbB in a Taiwan Wolbachia introgressed Ae. aegypti strain Liu;Wei-Liang;Yu;Hui-Ying;Chen;Yu-Xuan;Chen;Bo-Yu;Leaw;Ning, Shiang;Lin;Cheng-Han;Su;Matthew-P;Tsai;Ling-Shan;Chen;Yi;Shiao;Shin-Hong;Xi;Zhiyong;Jang;Anna, C-C;Chen;Chun-Hong
國立成功大學 2021-12 Finite Element Analysis on Initial Crack Site of Porous Structure Fabricated by Electron Beam Additive Manufacturing Tsai;Meng-Hsiu;Yang;Chia-Ming;Hung;Yu-Xuan;Jheng;Chao-Yong;Chen;Yen-Ju;Fu;Ho-Chung;Chen;In-Gann
國立成功大學 2021-05 Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon
國立成功大學 2020-12 Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions Wang;Yu-Xuan;Tai;Mao-Chou;Chang;Ting-Chang;Huang;Shin-Ping;Zheng;Yu-Zhe;Wu;Chia-Chuan;Shih;Yu-Shan;Chen;Yu-An;Sun;Pei-Jun;Lu;I-Nien;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學 2020-10-7 Optimal Retrofit of a Multiplant Heat Exchanger Network with a Fair Benefit Allocation Plan Lo;Fang-Yi;Zhu;Yu-Xuan;Chang;Chuei-Tin
國立成功大學 2018-10-22 Floating top gate-induced output enhancement of a-InGaZnO thin film transistors under single gate operations Tai;Mao-Chou;Chang;Ting-Chang;Chen;Ming-Chen;Chian;Hsiao-Cheng;Tsao;Yu-Ching;Chien;Yu-Chieh;Wang;Yu-Xuan;Tsai;Yu-Lin;Chen;Jian-Jie;Zhang;Shengdong;Chang;Hsi-Ming
國立成功大學 2018-07-11 HRPDviewer: human ribosome profiling data viewer Wu;Wei-Sheng;Jiang;Yu-Xuan;Chang;Jer-Wei;Chu;Yu-Han;Chiu;Yi-Hao;Tsao;Yi-Hong;Nordling;Torbjorn, E. M.;Tseng;Yan-Yuan;Tseng;Joseph, T.

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