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| 國立交通大學 |
2019-09-02T07:45:40Z |
Trapping and Detrapping of Oxide Border Traps in Al2O3 Gate Dielectric in MOS2 n-MOSFETs under PBTI Stress
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Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu |
| 國立交通大學 |
2018-08-21T05:54:00Z |
PBTI Investigation of MoS2 n-MOSFET With Al2O3 Gate Dielectric
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Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu |
| 國立交通大學 |
2017-04-21T06:56:31Z |
Investigation of Traps at MoS2/Al2O3 Interface in nMOSFETs by Low-Frequency Noise
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Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Liu, W. J.; Chin, Albert; Li, Ming-Fu |
Showing items 1-3 of 3 (1 Page(s) Totally)
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