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| 國立臺灣科技大學 |
2013 |
Experimental evaluation of hot electron reliability on differential Clapp-VCO
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Jang, S.L.;Yuan, J.S.;Yen, S.D.;Kritchanchai, E.;Huang, G.W. |
| 國立臺灣科技大學 |
2013 |
Reliability analysis of pHEMT power amplifier with an on-chip linearizer
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Yuan, J.-S.;Wang, Y.;Steighner, J.;Yen, H.-D.;Jang, S.-L.;Huang, G.-W.;Yeh, W.-K. |
| 國立高雄大學 |
2009-11 |
Impact of Oxide Trap Charge on Performance of Strained Fully Depleted SOI Metal-Gate MOSFET
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Yeh, W.K.; Wang, C.C.; Hsu, C.W.; Fang, Y.K.; Wu, S.M.; Ou, C.C.; Lin, C.L.; Gan, K.J.; Weng, C.J.; Chen, P.Y.; Yuan, J.S.; Liou, J.J. |
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