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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 1962451-1962460 / 2346460 (共234646頁)
<< < 196241 196242 196243 196244 196245 196246 196247 196248 196249 196250 > >>
每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2018-09-10T04:08:53Z |
Silicon metal-oxide-semiconductor solar cells with oxide prepared by room temperature anodization in hydrofluosilicic acid solution
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JENN-GWO HWU; Chen, C.-H.; Hong, C.-C.; Hwu, J.-G. |
| 臺大學術典藏 |
2018-09-10T04:08:53Z |
Reduction in leakage current of low-temperature thin-gate oxide by repeated spike oxidation technique
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Hong, C.-C.; Chang, C.-Y.; Lee, C.-Y.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T04:08:53Z |
Local thinning-induced oxide nonuniformity effect on the tunneling current of ultrathin gate oxide
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Hong, C.-C.; Chen, W.-R.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T04:08:54Z |
Improvement of oxide thickness uniformity by high then low O2 pressure oxidation in rapid thermal processing
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Hong, C.-C.; Chen, J.-L.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T04:08:54Z |
Improvement in ultrathin rapid thermal oxide uniformity by the control of gas flow
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Hong, C.-C.; Yen, Y.-R.; Su, J.-L.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T04:08:54Z |
Effect of mechanical stress on characteristics of silicon thermal oxides
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JENN-GWO HWU; Yen, J.-Y.; Huang, C.-H.; Hwu, J.-G. |
| 臺大學術典藏 |
2018-09-10T04:08:54Z |
Role of stress in irradiation-then-anneal technique used for improving radiation hardness of metal-insulator-semiconductor devices
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Shu, K.; Liao, C.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T04:08:54Z |
Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation
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Chang-Liao, K.-S.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T04:08:55Z |
Effect of starting oxide on electrical characteristics of metal-reoxidized nitrided oxide-semiconductor devices prepared by rapid thermal processes
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JENN-GWO HWU; Hwu, Jenn-Gwo; Chang-Liao, Kuei-Shu |
| 臺大學術典藏 |
2018-09-10T04:08:55Z |
Dependence of hot-carrier and radiation hardnesses of metal-oxide-semiconductor capacitors on initial oxide resistance determined by charge-then-decay method
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Lin, Jing-Jenn; Lin, Kuan-Chin; Hwu, Jenn-Gwo; JENN-GWO HWU |
顯示項目 1962451-1962460 / 2346460 (共234646頁)
<< < 196241 196242 196243 196244 196245 196246 196247 196248 196249 196250 > >>
每頁顯示[10|25|50]項目
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