| 臺大學術典藏 |
2018-09-10T07:43:03Z |
Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment
|
M.-F. Wu;J.-L. Huang;X. Wen;K. Miyase; M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:03Z |
LPTest: A Flexible Low-Power Test Pattern Generator
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M.-F. Wu;K.-S. Hu;J.-L. Huang; M.-F. Wu; K.-S. Hu; J.-L. Huang; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:03Z |
Specification back-propagation and its application to fault simulation of analog/mixed-signal circuits
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J. L. Huang; C. Y. Pan; K. T. (Tim) Cheng; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:03Z |
Characterizing Integrator Leakage of Single-Bit DS Modulator Using DC Input
|
X.-L. Huang;Y.-C. Yu;J.-L. Huang; X.-L. Huang; Y.-C. Yu; J.-L. Huang; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:04Z |
Co-Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADC
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X.-L. Huang;Yuan-Chi Yu;Jiun-Lang Huang; X.-L. Huang; Yuan-Chi Yu; Jiun-Lang Huang; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:04Z |
A Low Communication Overhead and Load Balanced Parallel ATPG with Improved Static Fault Partition Method
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K.-W. Yeh;M.-F. Wu;J.-L. Huang; K.-W. Yeh; M.-F. Wu; J.-L. Huang; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:04Z |
A Self-Testing Assisted Pipelined-ADC Calibration Technique
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J.-L. Huang;X.-L. Huang;P.-Y. Kang; J.-L. Huang; X.-L. Huang; P.-Y. Kang; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:04Z |
An On-Chip Integrator Leakage Characterization Technique and Its Applications to Switched Capacitor Circuits Testing
|
C.-Y. Yang;X.-L. Huang;J.-L. Huang; C.-Y. Yang; X.-L. Huang; J.-L. Huang; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:04Z |
Analog-to-Digital Converter
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Jiun-Lang Huang;Jui-Jer Huang;Chuan-Che Lee; Jiun-Lang Huang; Jui-Jer Huang; Chuan-Che Lee; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:43:04Z |
MMICs in the millimeter-wave regime
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H. Wang;K.-Y. Lin;Z.-M. Tasi;L.-H. Lu;H.-C. Lu;C.-H. Wang;J.-H. Tsai;T.-W. Huang;Y.-C. Lin; H. Wang; K.-Y. Lin; Z.-M. Tasi; L.-H. Lu; H.-C. Lu; C.-H. Wang; J.-H. Tsai; T.-W. Huang; Y.-C. Lin; LIANG-HUNG LU |
| 臺大學術典藏 |
2018-09-10T07:43:05Z |
A 40-GHz low-noise amplifier with a positive-feedback network in 0.18-μm CMOS
|
H.-H. Hsieh;L.-H. Lu; H.-H. Hsieh; L.-H. Lu; LIANG-HUNG LU |
| 臺大學術典藏 |
2018-09-10T07:43:05Z |
A 10 GHz phase-locked loop with a compact low-pass filter in 0.18 μm CMOS
|
S.-J. Li;H.-H. Hsieh;L.-H. Lu; S.-J. Li; H.-H. Hsieh; L.-H. Lu; LIANG-HUNG LU |
| 臺大學術典藏 |
2018-09-10T07:43:05Z |
A 0.6 V low-power wide-range delay-locked loop in 0.18 µm CMOS
|
C.-T. Lu;H.-H. Hsieh;L.-H. Lu; C.-T. Lu; H.-H. Hsieh; L.-H. Lu; LIANG-HUNG LU |
| 臺大學術典藏 |
2018-09-10T07:43:05Z |
An experimental ultra-low-voltage demodulator in 0.18 µm CMOS
|
L.-S. Lai;H.-H. Hsieh;P.-S. Weng;L.-H. Lu; L.-S. Lai; H.-H. Hsieh; P.-S. Weng; L.-H. Lu; LIANG-HUNG LU |
| 臺大學術典藏 |
2018-09-10T07:43:05Z |
Small- and large-signal operation of X-band CE and CB SiGe/Si power HBT’s
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J.-S. Rieh; L.-H. Lu; Z. Ma; X. Liu; P. B. K. Katehi; P. Bhattacharya; E. T. Croke; LIANG-HUNG LU |
| 臺大學術典藏 |
2018-09-10T07:43:05Z |
A Low-Jitter 8GHz to 10GHz Distributed DLL for Multiple-Phase Clock Generation
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K-J Hsian;Tai-Cheng Lee; K-J Hsian; Tai-Cheng Lee; TAI-CHENG LEE |
| 臺大學術典藏 |
2018-09-10T07:43:06Z |
Time-space test response compaction and diagnosis based on BCH codes
|
F. M. Wang;W.-C. Wang;J. C-M. Li; F. M. Wang; W.-C. Wang; J. C-M. Li; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:06Z |
Transition Fault Diagnosis Using At-speed Test Patterns
|
Shang-Feng Chao;Jheng-Yang Ciou;James Chien-Mo Li; Shang-Feng Chao; Jheng-Yang Ciou; James Chien-Mo Li; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:06Z |
Bridging Fault Diagnosis to Identify the Layer of Systematic Defects
|
B. R. Chen;J. C.M. Li; B. R. Chen; J. C.M. Li; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:07Z |
Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits
|
Shiue-Tsung Shen,;Wei-Hsiao Liu,;En-Hua Ma,;J. C.-M. Li,;I-Chun Cheng,; Shiue-Tsung Shen,; Wei-Hsiao Liu,; En-Hua Ma,; J. C.-M. Li,; I-Chun Cheng,; I-CHUN CHENG; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:07Z |
Power Scan: DFT for Power Switches in VLSI Designs
|
B. C. Bai; B. C. Bai; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:08Z |
Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs
|
B. C. Bai;A. K Li;J. C.M. Li;K. C. Wu; B. C. Bai; A. K Li; J. C.M. Li; K. C. Wu; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:08Z |
BIST Design Optimization for Large-Scale Embedded Memory Cores
|
T.-F. Chien;W.-C. Chao;J. C.-M. Li;K.-Y. Liao;Y.-W. Chang;M.-T. Chang;M.-H. Tsai;C.-M. Tseng; T.-F. Chien; W.-C. Chao; J. C.-M. Li; K.-Y. Liao; Y.-W. Chang; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:08Z |
Electronic Design Automation
|
J. C.-M. Li;M. Hsiao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T07:43:08Z |
包含未知訊號之測試結果壓縮設計
|
王偉哲;李建模; 王偉哲 李建模; CHIEN-MO LI |
