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Institution Date Title Author
國立成功大學 2015-05-13 Conducting Silver Networks Based on Electrospun Poly(Methyl Methacrylate) and Silver Trifluoroacetate Chen, Hung-Tao; Lin, Hsiu-Ling; Chen, In-Gann; Kuo, Changshu
淡江大學 2000-12-01 Conducting stress tests of asian stock portfolios-A comparison of models 林蒼祥
國立政治大學 2014 Conducting verbal reports to study Chinese-speaking English learners'' listening: The use of prompts 陳彩虹; Yeldham, MICHAEL;Chen, TSAI-HUNG Rainbow
國立交通大學 2014-12-08T15:09:49Z Conduction at domain walls in oxide multiferroics Seidel, J.; Martin, L. W.; He, Q.; Zhan, Q.; Chu, Y. -H.; Rother, A.; Hawkridge, M. E.; Maksymovych, P.; Yu, P.; Gajek, M.; Balke, N.; Kalinin, S. V.; Gemming, S.; Wang, F.; Catalan, G.; Scott, J. F.; Spaldin, N. A.; Orenstein, J.; Ramesh, R.
國立聯合大學 2009 Conduction Behavior of V-SrZrO3 Thin Film Showing Resistive Switching Lai, CH; Liu, CY; Tseng, TY
國立聯合大學 2008 Conduction behavior of V-SrZrO3 thin film showing resistive switching C.H. Lai, C.Y. Liu and T.Y. Tseng
國立成功大學 2009 Conduction Behavior of V-SrZrO3 Thin Film Showing Resistive Switching Lai, Chun-Hung; Liu, Chih-Yi; Tseng, Tseung-Yuen
國立臺灣大學 1988 Conduction Block and Dispersion in Hereditary Motor Sensory Neuropathy Oh, S. J.; 張權維; Oh, S. J.; Chang, Chein-Wei
國立交通大學 2014-12-08T15:36:44Z Conduction control at ferroic domain walls via external stimuli Yang, J. C.; Yeh, C. H.; Chen, Y. T.; Liao, S. C.; Huang, R.; Liu, H. J.; Hung, C. C.; Chen, S. H.; Wu, S. L.; Lai, C. H.; Chiu, Y. P.; Chiu, P. W.; Chu, Y. H.
臺大學術典藏 2019-12-27T07:48:38Z Conduction control at ferroic domain walls via external stimuli Yang, J. C.; Yeh, C. H.; Chen, Y. T.; Liao, S. C.; Huang, R.; Liu, H. J.; Hung, C. C.; Chen, S. H.; Wu, S. L.; Lai, C. H.; Chiu, Y. P.; Chiu, P. W.; Chu, Y. H.; YA-PING CHIU
臺大學術典藏 2018-09-10T14:58:24Z Conduction control at ferroic domain walls via external stimuli. YA-PING CHIU; YA-PING CHIU
國立臺灣科技大學 2009-11-02 Conduction Losses and Common Mode EMI Analysis on Bridgeless Power Factor Correction Qingnan Li;Michael A. E. Andersen;Ole C. Thomsen
國立交通大學 2019-04-03T06:41:13Z Conduction Mechanism and Improved Endurance in HfO2-Based RRAM with Nitridation Treatment Yuan, Fang-Yuan; Deng, Ning; Shih, Chih-Cheng; Tseng, Yi-Ting; Chang, Ting-Chang; Chang, Kuan-Chang; Wang, Ming-Hui; Chen, Wen-Chung; Zheng, Hao-Xuan; Wu, Huaqiang; Qian, He; Sze, Simon M.
國立交通大學 2014-12-08T15:48:51Z Conduction mechanism and temperature-dependent current-voltage in (Ba, Sr)TiO3 thin films Tsai, MS; Tseng, TY
國立交通大學 2017-04-21T06:50:04Z Conduction mechanisms and reliability characteristics in MgO resistive switching memory devices Chiu, Fu-Chien; Feng, Jun-Jea; Shih, Wen-Chieh; Cheng, Po-Yueh; Huang, Chih-Yao
國立交通大學 2014-12-08T15:43:37Z Conduction mechanisms for off-state leakage current of Schottky barrier thin-film transistors Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY
國立交通大學 2014-12-08T15:49:06Z Conduction mechanisms in amorphous and crystalline Ta2O5 thin films Ezhilvalavan, S; Tseng, TY
國立交通大學 2014-12-08T15:24:29Z CONDUCTION RADIATION INTERACTION IN ABSORBING, EMITTING, AND ANISOTROPICALLY SCATTERING MEDIA WITH VARIABLE THERMAL-CONDUCTIVITY CHU, HS; TSENG, CJ
淡江大學 2023-05-20 Conduction shape factor in exchanger tubes with a slit by using the meshfree boundary integral equation method 楊洪聞;李家瑋
國立高雄大學 2008 Conduction transition of nano-scaled molecular wires driven by environment coupling 孫士傑
國立中山大學 1996 Conduction-valence Landau level mixing effect Jih-Chen Chiang;Shiow-Fon Tsay;Z.M. Chau;Ikai Lo
中國醫藥大學 2011 Conductiv e carbon tape as a sample platform for microwave-based MALDI MS detection of proteins and phosphoproteins (Yu-Min Juang); 陳朝榮(Chao-Jung Chen); 賴建成(Chien-Chen Lai)*
國立臺灣科技大學 2018 Conductive and Robust Magneli-phase Ti4O7 Decorated Ni-based Layered Double Hydroxides towards Oxygen Evolution and Reduction Reaction Kassa Belay Ibrahim
元智大學 2003-01 Conductive and Transport Properties of Poly(ethylene oxide) / Layered Double Hydroxide Nanocomposite Polymer Electrolytes 葉偉斌; 廖建勛
臺大學術典藏 2018-09-10T05:58:40Z Conductive atomic force microscopy application for semiconductor failure analysis in advanced nanometer process Lin, K.; Zhang, H.; Lu, S.-S.; SHEY-SHI LU

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