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Institution Date Title Author
國立成功大學 2024-07-1 Impact of gas composition (CO, H2, and HCl) on chemical looping combustion by SiO2 supported oxygen carriers Winayu;Rara, Birgitta Narindri;Shen;Bai-Chun;Chu;Hsin
國立交通大學 2018-08-21T05:53:54Z Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors Zhong, Chia-Wen; Lin, Horng-Chih; Tsai, Jung-Ruey; Liu, Kou-Chen; Huang, Tiao-Yuan
國立交通大學 2017-04-21T06:48:58Z Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors Zhong, Chia-Wen; Lin, Horng-Chih; Tsai, Jung-Ruey; Liu, Kou-Chen; Huang, Tiao-Yuan
國立交通大學 2014-12-08T15:09:04Z Impact of Gate Leakage on Performances of Phase-Locked Loop Circuit in Nanoscale CMOS Technology Chen, Jung-Sheng; Ker, Ming-Dou
義守大學 2009-08 Impact of Gate Leakage on Performances of Phase-Locked Loop Circuit in Nanoscale CMOS Technology Jung-Sheng Chen;Ming-Dou Ker
臺大學術典藏 2018-09-10T15:19:17Z Impact of Gate Metal on the Performance of p-GaN/AlGaN/GaN High Electron Mobility Transistors Lee, Finella;Su, Liang-Yu;Wang, Chih-Hao;Wu, Yuh-Renn;Huang, Jianjang; Lee, Finella; Su, Liang-Yu; Wang, Chih-Hao; Wu, Yuh-Renn; Huang, Jianjang; JIAN-JANG HUANG; YUH-RENN WU
國立成功大學 2020-03 Impact of Gate Size on Abnormal Current Rise Under an Electric Field in Organic Thin-Film Transistors Chen;Hong-Chih;Chen;Guan-Fu;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Tu;Yu-Fa;Lu;I-Nien;Shih;Yu-Shan;Sun;Li-Chuan;Huang;Hui-Chun;Wu;Wen-Chi;Lai;Wei-Chih;Chang;Ting-Chang
國立交通大學 2014-12-08T15:09:26Z Impact of gate tunneling leakage on performances of phase locked loop circuit in nanoscale CMOS technology Chen, Jung-Sheng; Ker, Ming-Dou
國立交通大學 2014-12-08T15:25:19Z Impact of Gate-Oxide Breakdown on Power-Gated SRAM Yang, Hao-I; Chuang, Ching-Te; Hwang, Wei
國立成功大學 2009-04 Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal-Oxide-Semiconductor Field-Effect Transistors Wu, San-Lein; Wu, Chung Yi; Lin, Hau-Yu; Kuo, Cheng-Wen; Chen, Shin-Hsin; Lin, Chung Hsiung; Chang, Shoou-Jinn

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