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Showing items 538676-538700 of 2307984  (92320 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2021-02-20T08:35:40Z Leakage Assessments for Electronic Connectors Huang, Y.-W.; Liao, K.-C.; Huang, Y.-W.; Liao, K.-C.; KUO-CHI LIAO
國立交通大學 2014-12-08T15:39:12Z Leakage behavior of the quasi-superlattice stack for multilevel charge storage Chang, TC; Yan, ST; Liu, PT; Chen, CW; Wu, HH; Sze, SM
國立中山大學 2004 Leakage behavior of the quasi-superlattice stack for multilevel charge storage T.C. Chang;S.T. Yan;P.T. Liu;C.W. Chen;H.H. Wu;S.M. Sze
淡江大學 2002-02 Leakage characteristics in a channel consisting of a serrated wall 杜文謙
淡江大學 1998-02 Leakage characteristics of brush mounted labyrinth seal with rotating speed Miyake, Kunihiro; 杜文謙; Duh, Wen-chien
淡江大學 1999-02 Leakage Characteristics of Brush-Mounted Labyrinth Seal With Rotating Speed Miyake, Kunihiro; 杜文謙; Tu, Wen-ching
淡江大學 1990-08 Leakage Characteristics of Labyrinth Seal 三宅範博;杜文謙
國立交通大學 2014-12-08T15:19:10Z Leakage conduction behavior in electron-beam-cured nanoporous silicate films Liu, PT; Tsai, TM; Chang, TC
國立中山大學 2005 Leakage conduction behavior in electron-beam-cured nanoporous silicate films P.T. Liu;T.M. Tsai;T.C. Chang
國立彰化師範大學 2010-12 Leakage Conduction Mechanism of Top-contact Organic Thin Film Transistors Lin, Yow-Jon
國立聯合大學 2010 Leakage coupling of ultrasensitive periodical silica thin-film long-period grating coated on tapered fiber Cheng-Ling Lee*, Z.-Y. Weng, C.-J. Lin, Y.-Y. Lin
南台科技大學 2007 Leakage current analysis of nitride based optoelectronics by emission microscopy inspection Y. Z. Chiou; K. W. Lin
南台科技大學 2008-09 Leakage Current Analysis of Nitride-Based Photodetectors by Emission Microscopy Inspection Y. Z. Chiou
國立交通大學 2014-12-16T06:14:24Z Leakage current cut-off device for ternary content addressable memory Huang; Po-Tsang; Liu; Wen-Yen; Hwang; Wei
國立交通大學 2014-12-16T06:15:48Z Leakage current cut-off device for ternary content addressable memory Huang, Po-Tsang; Liu, Wen-Yen; Hwang, Wei
國立高雄師範大學 2002-12 Leakage Current Improvement of AlGaN/GaN HFETs by High Resistive Mg-Doped GaN Layer Ruey-Lue Wang;S. C. Wei;Y. K. Su;S. J. Chang;R. L. Wang;T. H. Hsu; 王瑞祿
國立中山大學 2007 Leakage Current Improvement of Liquid Phase Deposited TixSi(1-x)Oy Films on Amorphous Silicon with Ammonium Hydroxide Incorporation by Post Metallization Annealing Ming-Kwei Lee; Hung-Chang Lee; Chih-Te Chang; Chih-Min Hsu
國立交通大學 2014-12-08T15:15:07Z Leakage current improvement of Ni/TiNiO/TaN metal-insulator-metal capacitors using optimized N+ plasma treatment and oxygen annealing Huang, C. C.; Cheng, C. H.; Chin, Albert; Chou, C. P.
修平科技大學 2004-03 Leakage Current Mechanisms in Rapid Thermal Annealed LiTaO3 Thin Films Prepared by a Diol-Based Sol-Gel Method M. C. Kao;Y. C. Chen;H. Z. Chen;C. M. Wang;Yi-Ju Li
國立中山大學 2004 Leakage Current Mechanisms in Rapid Thermal Annealed LiTaO3 Thin Films Prepared by a Diol-Based Sol-Gel Method M.C. Kao; Y.C. Chen; H.Z. Chen; C.M. Wang; Y.J. Li
國立中山大學 2003-08 Leakage Current Mechanisms in Rapid Thermal Annealed LiTaO3 Thin Films Prepared by a Diol-Based Sol-Gel Method M.C. Kao;Y.C. Chen;H.Z. Chen;C.M. Wang;Y.J. Li
國立交通大學 2014-12-08T15:02:33Z Leakage current reduction in chemical-vapor-deposited Ta2O5 films by rapid thermal annealing in N2O Sun, SC; Chen, TF
國立交通大學 2019-04-02T05:58:30Z Leakage current reduction in chemical-vapor-deposited Ta2O5 films by rapid thermal annealing in N2O Sun, SC; Chen, TF
國立交通大學 2014-12-08T15:46:43Z Leakage current reduction of chemical-vapor-deposited Ta2O5 films on rugged polycrystalline silicon electrode for dynamic random access memory application Lin, M; Chang, CY; Huang, TY; Shieh, WY
國立彰化師範大學 2011-05 Leakage Currents Through In/MgO/n-type Si/In Structures Tsao, Hou-Yen; Lin, Yow-Jon; Chen, Ya-Hui; Chang, Hsing-Cheng

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