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Institution Date Title Author
臺大學術典藏 2020-02-14T03:18:13Z Oxidative transformation of N-substituted 2-aminophenols to 2-substituted benzoxazoles catalyzed by polymer-incarcerated and carbon-stabilized platinum nanoclusters Woo-Jin Yoo; Hao Yuan; Hiroyuki Miyamura; Shū Kobayashi
國家衛生研究院 2023-06-22 Oxidative/nitrative stress biomarkers increased the risk of recurrent pregnancy loss Huang, PC;Lin, YJ;Kuo, PL
國家衛生研究院 2023-12 Oxidative/nitrosative stress increased the risk of recurrent pregnancy loss–Taiwan Recurrent Pregnancy Loss and Environmental Study (TREPLES) Lin, YJ;Chang, WH;Kuo, PL;Chen, HC;Chang, WT;Huang, PC
國立成功大學 2023 Oxidative/nitrosative stress increased the risk of recurrent pregnancy loss–Taiwan Recurrent Pregnancy Loss and Environmental Study (TREPLES) Lin, Y.-J.;Chang, W.-H.;Kuo, P.-L.;Chen, H.-C.;Chang, W.-T.;Huang, P.-C.
中山醫學大學 2010-03 Oxidatively damaged DNA induced by humic acid and arsenic in maternal and neonatal mice CW, Hu; CC, Yen; YL, Huang; CH, Pan; FJ, Lu; MR, Chao
中山醫學大學 2010-03 Oxidatively damaged DNA induced by humic acid and arsenic in maternal and neonatal mice. Hu CW;Yen CC;Huang YL;Pan CH;Lu FJ;Chao MR
國立交通大學 2014-12-08T15:06:02Z OXIDE CONDUCTIVE COATED CATHODES FOR A SEALED-OFF CO2-LASER HSIEH, TC; LAN, YL
國立成功大學 2003-05 Oxide confined collector-up heterojunction bipolar transistors Chen, Wen-Bin; Su, Yan-Kuin; Lin, Chun-Liang; Wang, Hsin-Chuan; Su, Juh-Yuh; Wu, Meng-Chi; Chen, Shi-Ming; Chen, Hong-Ren
國立成功大學 2003-08 Oxide degradation mechanism in stacked-gate flash memory using the cell array stress test Tsai, Shih-Hung; Hung, Jui-Sheng; Wang, Na-Fu; Horng, Jui-Hong; Houng, Mau-Phon; Wang, Yeong-Her
國立東華大學 2005-05 Oxide Films of Multi-Element FeCoNiCrCuAl0.5 Alloy by Reactive DC Sputtering Wong,M.S.; Chen,T.K.
國立交通大學 2014-12-08T15:17:51Z Oxide grown on polycrystal silicon by rapid thermal oxidation in N2O Kao, CH; Lai, CS; Lee, CL
國立交通大學 2017-04-21T06:55:59Z Oxide Heteroepitaxy for Flexible Optoelectronics Bitla, Yugandhar; Chen, Ching; Lee, Hsien-Chang; Do, Thi Hien; Ma, Chun-Hao; Van Qui, Le; Huang, Chun-Wei; Wu, Wen-Wei; Chang, Li; Chiu, Po-Wen; Chu, Ying-Hao
國立交通大學 2019-09-02T07:46:18Z Oxide Heteroepitaxy-Based Flexible Ferroelectric Transistor Tsai, Meng-Fu; Jiang, Jie; Shao, Pao-Wen; Lai, Yu-Hong; Chen, Jhih-Wei; Ho, Sheng-Zhu; Chen, Yi-Chun; Tsai, Din-Ping; Chu, Ying-Hao
國立成功大學 2019 Oxide Heteroepitaxy-Based Flexible Ferroelectric Transistor Tsai, M.-F.;Jiang, Jiang J.;Shao, P.-W.;Lai, Y.-H.;Chen, J.-W.;Ho, S.-Z.;Chen, Y.-C.;Tsai, D.-P.;Chu, Y.-H.
國立交通大學 2014-12-08T15:24:27Z Oxide interfaces: pathways to novel phenomena Yu, Pu; Chu, Ying-Hao; Ramesh, Ramamoorthy
國立中山大學 2007-06 Oxide Islands Design for Elimination of Ultra-shallow Junction Formation Jyi-Tsong Lin;Yi-Chuen Eng
大葉大學 2015-12-18 Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage Fan, Jung-Chuan;Lee, Tsung-Che;Lee, Li-Ying;Lee, Shih-Fong
大葉大學 2016-07-11 Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage Fan, Jung-Chuan;Lee, Shih-Fong
國立成功大學 2009-11-18 Oxide mediated liquid-solid growth of high aspect ratio aligned gold silicide nanowires on Si(110) substrates Bhatta, Umananda M.; Rath, Ashutosh; Dash, Jatis K.; Ghatak, Jay; Lai Yi-Feng; Liu, Chuan-Pu; Satyam, P. V.
臺大學術典藏 1990-07 Oxide Resistance Characterization in MOS structures by the Voltage Decay Method Hwu, Jenn-Gwo; Ho, I-Hsiu; Hwu, Jenn-Gwo; Ho, I-Hsiu
國立臺灣大學 1990-07 Oxide Resistance Characterization in MOS structures by the Voltage Decay Method Hwu, Jenn-Gwo; Ho, I-Hsiu
臺大學術典藏 2018-09-10T04:13:01Z Oxide roughness effect on tunneling current of MOS diodes Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.; CHEE-WEE LIU
國立臺灣大學 2002 Oxide roughness effect on tunneling current of MOS diodes Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.
臺大學術典藏 2018-09-10T03:48:04Z Oxide roughness enhanced reliability of MOS tunneling diodes Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU
國立臺灣大學 2001-12 Oxide roughness enhanced reliability of MOS tunneling diodes Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W.

Showing items 641216-641240 of 2314428  (92578 Page(s) Totally)
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