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Institution	Date	Title	Author
國立臺灣大學	2011	Rapid Thermal Annealing Induced Metastable Phase in FePt Thin Films	Mei, J.K.; Yuan, F.T.; Liao, W.M.; Yao, Y.D.; Lin, H.M.; Hsu, J.H.; Lee, H.Y.
國立成功大學	2009-03-05	Rapid thermal annealing of chemical bath-deposited CuxS films and their characterization	Nien, Yung-Tang; Chen, In-Gann
國立交通大學	2014-12-08T15:27:48Z	Rapid thermal chemical vapor deposition of in-situ nitrogen-doped polysilicon for dual gate CMOS	Sun, SC; Wang, LS; Yeh, FL; Chen, CH
國立交通大學	2014-12-08T15:27:45Z	Rapid thermal chemical vapor deposition of nitrogen-doped polysilicon for high-performance and high-reliability CMOS technology	Sun, SC; Wang, LS; Yeh, FL
臺大學術典藏	2016	Rapid thermal conductivity measurement of porous thermal insulation material by laser flash method	Abe, H.; Ohmura, T.; Tuan, W.-H.; Naito, M.; WEI-HSING TUAN; Akoshima, M.; Kondo, A.; Lian, T.-W.
國立交通大學	2014-12-12T02:16:27Z	RAPID THERMAL DIFFUSION OF ZINC ATOMS IN GaAs，InP，GaP SEMICONDUCTORS	莊忠仁; Zhuang, Zhong-Ren; 楊賜麟; Yang, Si-Lin
臺大學術典藏	2018-09-10T07:11:58Z	Rapid Thermal Oxide passivation using IC-grade processing	Borden, P.; Xu, L.; McDougall, B.; Chang, C.P.; Tam, N.; LI XU
臺大學術典藏	1994	Rapid Thermal Post-Metallization Annealing Effect on the Reliability of Thin Gate Oxides	Lin, H. S.; Hwu, Jenn-Gwo; Jeng, M. J.; 胡振國; Jeng, M. J.; Lin, H. S.; Hwu, Jenn-Gwo; Jeng, M. J.
國立臺灣大學	1994	Rapid Thermal Post-Metallization Annealing Effect on the Reliability of Thin Gate Oxides	胡振國; Jeng, M. J.; Lin, H. S.; Hwu, Jenn-Gwo; Jeng, M. J.; Lin, H. S.
國立臺灣大學	1996	Rapid thermal post-metallization annealing effect on thin gate oxides	Jeng, Ming-Jer; Lin, Huang-Shen; Hwu, Jenn-Gwo

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