| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of Gate Oxides in Metal-Oxide- Semiconductor Devices by Repeated Rapid Thermal Oxidations in N20
|
胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 臺大學術典藏 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M. |
| 臺大學術典藏 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 臺大學術典藏 |
2020-06-11T06:42:10Z |
Improvement in radiation hardness of n-MOSFET's with gate oxides prepared by multiple N2O annealings
|
Wu, Y.-L.;Kuo, K.-M.;Hwu, J.-G.; Wu, Y.-L.; Kuo, K.-M.; Hwu, J.-G.; JENN-GWO HWU |
| 國立臺灣大學 |
1989 |
Improvement in radiation hardness of oxide by successive irradiation-then-anneal treatments
|
Hwu, Jenn-Gwo; Fu, Shyh-Liang |
| 臺大學術典藏 |
2018-09-10T07:29:09Z |
Improvement in radiation hardness of oxide by successive irradiation-then-anneal treatments
|
Hwu, J.-G.;Fu, S.-L.; Hwu, J.-G.; Fu, S.-L.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-07-06T15:02:04Z |
Improvement in Radiation Hardness of Rapid Thermal Nitrided Oxides by Repeated Irradiation-Then-Anneal Treatments
|
Lu, W. S.; Hwu, Jenn-Gwo; Lu, W. S.; 胡振國; Lu, W. S.; Hwu, Jenn-Gwo; Lu, W. S. |
| 國立臺灣大學 |
1993 |
Improvement in Radiation Hardness of Rapid Thermal Nitrided Oxides by Repeated Irradiation-Then-Anneal Treatments
|
胡振國; Lu, W. S.; Hwu, Jenn-Gwo; Lu, W. S. |
| 國立臺灣大學 |
1993 |
Improvement in Radiation Hardness of Reoxidized Nitrided Oxide (RNO) in the Absence of Post-Oxidation Anneal
|
胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1997-06 |
Improvement in radiation-hard CMOS logic gates for noise margin
|
Yih, S.-J.; Chang, M.-L.; Hwu, J.-G.; Feng, W.-S. |
| 淡江大學 |
2007-06 |
Improvement in Recovery of Deuterium from Water-Isotopes Mixture in Concentric-Tube Thermal Diffusion Columns
|
葉和明 |
| 淡江大學 |
2003-08 |
Improvement in recovery of deuterium from water–isotopes mixture in inclined thermal-diffusion columns
|
Yeh, Ho-ming |
| 國立臺灣科技大學 |
2016 |
Improvement in reliability of amorphous indium-gallium-zinc oxide thin-film transistors with Teflon/SiO2 bilayer passivation under gate bias stress
|
Fan, C.-L;Tseng, F.-P;Li, B.-J;Lin, Y.-Z;Wang, S.-J;Lee, W.-D;Huang, B.-R. |
| 臺大學術典藏 |
2018-07-06T15:02:04Z |
Improvement in Reliability of n-MOSFETs by Using Rapid Thermal N20- Reoxidized Gate Oxides
|
Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y.; 胡振國; Wu, Y. L.; Wu, Z. Y.; Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y. |
| 國立臺灣大學 |
1995 |
Improvement in Reliability of n-MOSFETs by Using Rapid Thermal N20- Reoxidized Gate Oxides
|
胡振國; Wu, Y. L.; Wu, Z. Y.; Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y. |
| 國立臺灣大學 |
1995 |
Improvement in reliability of n-MOSFETs by using rapid thermal N2O-reoxidized nitrided gate oxides
|
Wu, You-Lin; Wu, Zhao-Yin; Hwu, Jenn-Gwo |
| 臺北醫學大學 |
2008 |
Improvement in Resolution of Laser Capture Microdissection Using Near Field Probe to Capture Nano-particles
|
李仁愛; Chen CM*; Lee JA; Yen CF ; |
| 國立交通大學 |
2014-12-08T15:40:30Z |
Improvement in retention time of metal-ferroelectric-metal-insulator-semiconductor structures using MgO doped Ba0.7Sr0.3TiO3 insulator layer
|
Tseng, TY; Lee, SY |
| 國立交通大學 |
2014-12-08T15:38:24Z |
Improvement in RF performance of 40-nm InAs-channel based HEMTs using Pt gate sinking with two-step recess processes technology
|
Kuo, Chien-I; Hsu, Heng-Tung; Wu, Chien-Ying; Chang, Edward Y.; Chen, Yu-Lin; Lim, Wee-Chin |
| 元智大學 |
2010-12 |
Improvement in RF Performance of 40-nm InAs-Channel Based HEMTs Using Pt Gate Sinking With Two-Step Recess Processes Technology
|
C.I.Kuo; Heng-Tung Hsu; Chien-Ying Wu; E.Y.Chang; Chen-Yu Lin; Wee-Chin Lim |
| 元智大學 |
2010-12 |
Improvement in RF Performance of 40-nm InAs-Channel Based HEMTs Using Pt Gate Sinking With Two-Step Recess Processes Technology
|
C.I.Kuo; Heng-Tung Hsu; Chien-Ying Wu; E.Y.Chang; Chen-Yu Lin; Wee-Chin Lim |
| 中國文化大學 |
2012-09 |
Improvement in safety and cycle life of lithium-ion batteries by employing quercetin as an electrolyte additive
|
Lee, ML (Lee, Meng-Lun); Li, YH (Li, Yu-Han); Yeh, JW (Yeh, Jien-Wei); Shih, HC (Shih, Han C.) |
| 淡江大學 |
1971-06 |
Improvement in separation of concentric tube thermal diffusion columns
|
Yeh, Ho-ming; Ward, Henderson C. |
| 淡江大學 |
1981-01 |
Improvement in separation of concentric-tube thermal diffusion columns with viscous heat generation under consideration of the curvature effect
|
葉和明; Yeh, Ho-ming; Tsai, Shau-wei |
| 國立成功大學 |
2012-08 |
Improvement in stage measuring technique of the ultrasonic sensor gauge
|
Tsai, Tsung-Min; Yen, Pei-Hwa |
| 義守大學 |
2015-06 |
Improvement in strength and thermal conductivity of powder metallurgy produced Cu–Ni–Si–Cr alloy by adjusting Ni/Si weight ratio and hot forging
|
Huei-Sen Wang;Hou-Guang Chen;Jhen-Wang Gu;Cheng-En Hsu;Chung-Yung Wu |
| 臺大學術典藏 |
1992 |
Improvement in Surface Cleaning of Oxides by Rapid Thermal Annealing
|
Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J.; 胡振國; Lin, J. J.; Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J. |
| 國立臺灣大學 |
1992 |
Improvement in Surface Cleaning of Oxides by Rapid Thermal Annealing
|
胡振國; Lin, J. J.; Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J.; Wu, Y. L. |
| 義守大學 |
2015-08 |
Improvement in T helper 1-related immune responses in BALB/c mice immunized with an HIV-1 gag plasmid combined with a chimeric plasmid encoding interleukin-18 and flagellin
|
Ya-Lei Chen;Yao-Shen Chen;Yi-Chien Hung;Pei-Ju Liu;Hsi-Ying Tasi;Wei-Feng Ni;Pei-Tan Hseuh;Hsi-Hsun Lin |
| 國立交通大學 |
2014-12-08T15:33:45Z |
Improvement in the bias stability of amorphous InGaZnO TFTs using an Al2O3 passivation layer
|
Huang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Te-Chih; Jian, Fu-Yen; Chen, Yu-Chun; Huang, Hui-Chun; Gan, Der-Shin |
| 國立中山大學 |
1994 |
Improvement in the binding of cobrotoxin to microtiter plates by glutaraldehyde at neutral pH
|
L.S. Chang;J. Lin;C.C. Chang |
| 臺大學術典藏 |
2019-12-11T01:47:51Z |
Improvement in the biochemical and chemical properties of badland soils by thorny bamboo
|
Shiau, Y.-J.; Wang, H.-C.; Chen, T.-H.; Jien, S.-H.; Tian, G.; Chiu, C.-Y.; YO-JIN SHIAU |
| 臺大學術典藏 |
2018-09-10T14:54:16Z |
Improvement in the breakdown endurance of high-κ dielectric by utilizing stacking technology and adding sufficient interfacial layer
|
Pang, C.-S.;Hwu, J.-G.; Pang, C.-S.; Hwu, J.-G.; JENN-GWO HWU |
| 國立臺灣海洋大學 |
2006-07-45 |
Improvement in the Characteristics of GaN-Based Light-Emitting Diodes by Inserting AlGaN–GaN Short-Period Superlattices in GaN Underlayers
|
Cheng-Liang Wang;Jyh-Rong Gong;Member;IEEE;Ming-Fa Yeh;Bor-Jen Wu;Wei-Tsai Liao;Tai-Yuan Lin;Chung-Kwei Lin |
| 國立臺灣科技大學 |
2012 |
Improvement in the clinical practicability of roentgen stereophotogrammetric analysis (RSA): Free from the use of the dual X-ray equipment
|
Shih, Kao-Shang;Lee, Chian-Her;Syu, Ci-Bin;Lai, Jiing-Yih;Chen, Kuo-Jen;Lin, Shang-Chih |
| 國立臺灣科技大學 |
2012 |
Improvement in the clinical practicability of roentgen stereophotogrammetric analysis (RSA): Free from the use of the dual X-ray equipment
|
Shih, K.-S.;Lee, C.-H.;Syu, C.-B.;Lai, J.-Y.;Chen, K.-J.;Lin, S.-C. |
| 國立暨南國際大學 |
2009 |
Improvement in the Cumulative Failure Distribution of High-k Dielectric Subjected to Nanoscale Stress by D-2 Post-Deposition Annealing
|
黃瓊儀?; Huang, CY |
| 國立暨南國際大學 |
2009 |
Improvement in the Cumulative Failure Distribution of High-k Dielectric Subjected to Nanoscale Stress by D-2 Post-Deposition Annealing
|
梁正勳?; Liang, CH |
| 國立暨南國際大學 |
2009 |
Improvement in the Cumulative Failure Distribution of High-k Dielectric Subjected to Nanoscale Stress by D-2 Post-Deposition Annealing
|
吳幼麟?; Wu, YL |
| 臺大學術典藏 |
2018-09-10T07:29:08Z |
Improvement in the electrical properties of thin gate oxides by chemical-assisted electron stressing followed by annealing (CAESA)
|
Shih, Y.-H.; Hwu, J.-G.; JENN-GWO HWU |
| 國立臺灣大學 |
1999 |
Improvement in the electrical properties of thin gate oxides bychemical-assisted electron stressing followed by annealing (CAESA)
|
Shih, Yen-Hao; Hwu, Jenn-Gwo |
| 國立臺灣科技大學 |
2020 |
Improvement in the electrochemical stability of Li[Ni0.5Co0.2Mn0.3]O2 as a lithium-ion battery cathode electrode with the surface coating of branched oligomer
|
Chemere, E.B.;Wang, F.-M.;Chien, W.-C. |
| 臺大學術典藏 |
1990 |
Improvement in the Interface Property of Thin Gate Oxide by Successive Irradiation-Then-Anneal Treatments
|
Hwu, Jenn-Gwo; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
1990 |
Improvement in the Interface Property of Thin Gate Oxide by Successive Irradiation-Then-Anneal Treatments
|
胡振國; Hwu, Jenn-Gwo |
| 國立交通大學 |
2015-12-02T02:59:27Z |
Improvement in the light conversion efficiency of silicon solar cells by pure hydrogen annealing
|
Xie, M. H.; Chen, J. Y.; Sun, K. W. |
| 國立成功大學 |
2009-07-15 |
Improvement in the Light Output Power of GaN-Based Light-Emitting Diodes by Natural-Cluster Silicon Dioxide Nanoparticles as the Current-Blocking Layer
|
Tsai, Chun-Fu; Su, Yan-Kuin; Lin, Chun-Liang |
| 國立成功大學 |
2006-11 |
Improvement in the microstructure and tensile properties of inconel 718 superalloy by HIP treatment
|
Lee, Shih-Chin; Chang, Shih-Hsien; Tang, Tzu-Piao; Ho, Hsin-Hung; Chen, Jhewn-Kuang |
| 中山醫學大學 |
2021-08 |
Improvement in the Mortality-to-Incidence Ratios for Gastric Cancer in Developed Countries With High Health Expenditures
|
Tzu-Wei Yang 1 2, Chi-Chih Wang 1 2 3, Wei-Cheng Hung 4 5, Yu-Hsiang Liu 2, Wen-Wei Sung 2 3 6, Ming-Chang Tsai 1 2 3 |
