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Showing items 189986-189995 of 2348487 (234849 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:50:14Z |
Anomalous Electrostatics and Intrinsic Variability in GeOI p-MOSFET
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Yu, Chang-Hung; Su, Pin |
| 國立臺灣大學 |
2006-06 |
Anomalous Energy Shift of Emission Spectra of ZnO Nanorods with Sizes beyond Quantum Confinement Regime
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Chen, CW; Chen, KH; Shen, CH; Ganguly, A; Chen, LC; Wu, JJ; Wen, HI; Pong, WF |
| 臺大學術典藏 |
2020-03-03T02:33:24Z |
Anomalous enhancement of resurgent Na+ currents at high temperatures by SCN9A mutations underlies the episodic heat-enhanced pain in inherited erythromelalgia
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Huang C.-W.; Lai H.-J.; Huang P.-Y.; MING-JEN LEE; Kuo C.-C. |
| 臺大學術典藏 |
2020-06-30T07:15:19Z |
Anomalous enhancement of resurgent Na+ currents at high temperatures by SCN9A mutations underlies the episodic heat-enhanced pain in inherited erythromelalgia
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Huang C.-W.;Lai H.-J.;Huang P.-Y.;Lee M.-J.;Chung-Chin Kuo; Huang C.-W.; Lai H.-J.; Huang P.-Y.; Lee M.-J.; Chung-Chin Kuo |
| 臺大學術典藏 |
2019-12-01 |
Anomalous enhancement of resurgent Na+ currents at high temperatures by SCN9A mutations underlies the episodic heat-enhanced pain in inherited erythromelalgia
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Huang, Po Yuan; CHUNG-CHIN KUO; MING-JEN LEE; Lai, Hsing Jung; Huang, Chiung Wei; Huang, Po Yuan;CHUNG-CHIN KUO;MING-JEN LEE;Lai, Hsing Jung;Huang, Chiung Wei |
| 臺大學術典藏 |
2018-09-10T05:18:36Z |
Anomalous exciton lifetime increasing trend with temperature in ZnO thin films
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Jen, F.-Y.; Lu, Y.-C.; Chen, C.-Y.; Wang, H.-C.; Yang, C.C.; Zhang, B.-P.; Segawa, Y.; CHIH-CHUNG YANG |
| 國立成功大學 |
2007-11-07 |
Anomalous formation of InGaN/GaN multiple-quantum-well nanopillar arrays by focused ion beam milling
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Wu, Shang-En; Liu, Chuan-Pu; Hsueh, Tao-Hung; Chung, Hung-Chin; Wang, Chih-Chin; Wang, Cheng-Yu |
| 國立成功大學 |
2013 |
Anomalous frequency characteristics of groundwater level before major earthquakes in Taiwan
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Chen, C. -H.; Wang, C. -H.; Wen, S.; Yeh, T. -K.; Lin, C. -H.; Liu, J. -Y.; Yen, H. -Y.; Lin, C.; Rau, R. -J.; Lin, T. -W. |
| 國立交通大學 |
2014-12-08T15:32:49Z |
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M. |
| 國立成功大學 |
2013 |
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M. |
Showing items 189986-189995 of 2348487 (234849 Page(s) Totally)
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